Evaluation of structural, morphological, optical, and electrical properties of zinc oxide semiconductor nanoparticles with microwave plasma treatment for electronic device applications

• Published in: Journal of materials research and technology Vol. 19; pp. 2126 - 2134
• Main Authors: Saleem, Shahroz, Jameel, Muhammad Hasnain, Rehman, Azka, Tahir, Muhammad Bilal, Irshad, Muhammad Imran, Jiang, Zhen-Yi, Malik, R.Q., Hussain, Abdul Ahad, Rehman, Ateeq ur, Jabbar, Abdullah Hasan, Alzahrani, Abdullah Y., Salem, Mohamed A., Hessien, M.M.
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 01.07.2022; Elsevier
• Subjects: Device applications; Plasma treatment; Raman; SEM; XRD; ZnO Semiconductor; UV; Plasma treatment; ZnO Semiconductor; Device applications; SEM; Raman; XRD; IV

ZnO is an important II-IV n-type direct bandgap semiconductor material that has exhibited wide consideration due to its applications in optoelectronic devices. In the present investigation, untreated and plasma-treated ZnO NPs were fabricated by a sol-gel route and analyzed with XRD, Raman, UV-Vis s...