Thickness determination of MoS2, MoSe2, WS2 and WSe2 on transparent stamps used for deterministic transfer of 2D materials
Here, we propose a method to determine the thickness of the most common transition metal dichalcogenides (TMDCs) placed on the surface of transparent stamps, used for the deterministic placement of two-dimensional materials, by analyzing the red, green and blue channels of transmission-mode optical...
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| Published in | Nano research Vol. 12; no. 7; pp. 1691 - 1695 |
|---|---|
| Main Authors | , , , , , , , , , |
| Format | Journal Article |
| Language | English |
| Published |
Beijing
Tsinghua University Press
01.07.2019
Springer Nature B.V |
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| Online Access | Get full text |
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| Abstract | Here, we propose a method to determine the thickness of the most common transition metal dichalcogenides (TMDCs) placed on the surface of transparent stamps, used for the deterministic placement of two-dimensional materials, by analyzing the red, green and blue channels of transmission-mode optical microscopy images of the samples. In particular, the blue channel transmittance shows a large and monotonic thickness dependence, making it a very convenient probe of the flake thickness. The method proves to be robust given the small flake-to-flake variation and the insensitivity to doping changes of MoS
2
. We also tested the method for MoSe
2
, WS
2
and WSe
2
. These results provide a reference guide to identify the number of layers of this family of materials on transparent substrates only using optical microscopy. |
|---|---|
| AbstractList | Here, we propose a method to determine the thickness of the most common transition metal dichalcogenides (TMDCs) placed on the surface of transparent stamps, used for the deterministic placement of two-dimensional materials, by analyzing the red, green and blue channels of transmission-mode optical microscopy images of the samples. In particular, the blue channel transmittance shows a large and monotonic thickness dependence, making it a very convenient probe of the flake thickness. The method proves to be robust given the small flake-to-flake variation and the insensitivity to doping changes of MoS2. We also tested the method for MoSe2, WS2 and WSe2. These results provide a reference guide to identify the number of layers of this family of materials on transparent substrates only using optical microscopy. Here, we propose a method to determine the thickness of the most common transition metal dichalcogenides (TMDCs) placed on the surface of transparent stamps, used for the deterministic placement of two-dimensional materials, by analyzing the red, green and blue channels of transmission-mode optical microscopy images of the samples. In particular, the blue channel transmittance shows a large and monotonic thickness dependence, making it a very convenient probe of the flake thickness. The method proves to be robust given the small flake-to-flake variation and the insensitivity to doping changes of MoS 2 . We also tested the method for MoSe 2 , WS 2 and WSe 2 . These results provide a reference guide to identify the number of layers of this family of materials on transparent substrates only using optical microscopy. |
| Author | Frisenda, Riccardo Niehues, Iris Michaelis de Vasconcellos, Steffen Schmidt, Robert Bratschitsch, Rudolf Gant, Patricia Castellanos-Gomez, Andres Taghavi, Najme S. García-Hernández, Mar Huang, Peng |
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| Copyright | Tsinghua University Press and Springer-Verlag GmbH Germany, part of Springer Nature 2019 Nano Research is a copyright of Springer, (2019). All Rights Reserved. Tsinghua University Press and Springer-Verlag GmbH Germany, part of Springer Nature 2019. |
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| Keywords | transparent substrate trasmittance transition metal dichalcogenides optical identification |
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| SubjectTerms | Atomic/Molecular Structure and Spectra Biomedicine Biotechnology Chemistry and Materials Science Condensed Matter Physics Dependence Flakes Image transmission Light microscopy Materials Science Microscopes Microscopy Molybdenum compounds Molybdenum disulfide Nanotechnology Optical microscopy Research Article Substrates Thickness Transition metal compounds Tungsten disulfide Two dimensional analysis Two dimensional materials |
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| Title | Thickness determination of MoS2, MoSe2, WS2 and WSe2 on transparent stamps used for deterministic transfer of 2D materials |
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