Weibull strength size effect of diamond wire sawn photovoltaic silicon wafers - Carton, Louise; Riva, Roland; Nélias, Daniel; Fourmeau, Marion (Journal of the European Ceramic Society, 2020)
Keywords: Chemical Sciences; Diamond wire sawing; Four-line bending; Silicon wafer; Strength size effect; Weibull distribution; Strength size effect; Weibull distribution; Four-line bending; Diamond wire sawing; Silicon wafer