Characterisation of titanium oxide layers using Raman spectroscopy and optical profilometry: Influence of oxide properties

• Published in: Results in physics Vol. 12; pp. 1574 - 1585
• Main Authors: Ekoi, E.J., Gowen, A., Dorrepaal, R., Dowling, D.P.
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 01.03.2019; Elsevier
• Subjects: Microwave plasma; Raman intensity; Raman mapping; Raman spectroscopy; Surface roughness parameters; Titanium oxidation; Microwave plasma; Surface roughness parameters; Raman spectroscopy; Raman mapping; Titanium oxidation; Raman intensity

[Display omitted] This study evaluates the use of a combination of Raman spectroscopy and optical profilometry as a surface characterisation technique for the examination of oxide layers grown on titanium metal substrates. The titanium oxide layers with thickness of up to 8 µm, were obtained using a...