Characterisation of titanium oxide layers using Raman spectroscopy and optical profilometry: Influence of oxide properties - Ekoi, E.J.; Gowen, A.; Dorrepaal, R.; Dowling, D.P. (Results in physics, 2019)
Keywords: Microwave plasma; Raman intensity; Raman mapping; Raman spectroscopy; Surface roughness parameters; Titanium oxidation; Microwave plasma; Surface roughness parameters; Raman spectroscopy; Raman mapping; Titanium oxidation; Raman intensity