APA (7th ed.) Citation

Ekoi, E., Gowen, A., Dorrepaal, R., & Dowling, D. (2019). Characterisation of titanium oxide layers using Raman spectroscopy and optical profilometry: Influence of oxide properties. Results in physics, 12, 1574-1585. https://doi.org/10.1016/j.rinp.2019.01.054

Chicago Style (17th ed.) Citation

Ekoi, E.J, A. Gowen, R. Dorrepaal, and D.P Dowling. "Characterisation of Titanium Oxide Layers Using Raman Spectroscopy and Optical Profilometry: Influence of Oxide Properties." Results in Physics 12 (2019): 1574-1585. https://doi.org/10.1016/j.rinp.2019.01.054.

MLA (9th ed.) Citation

Ekoi, E.J, et al. "Characterisation of Titanium Oxide Layers Using Raman Spectroscopy and Optical Profilometry: Influence of Oxide Properties." Results in Physics, vol. 12, 2019, pp. 1574-1585, https://doi.org/10.1016/j.rinp.2019.01.054.