Minimizing electrostatic interactions from piezoresponse force microscopy via capacitive excitation
•Capacitive excitation piezoresponse force microscopy (PFM) is developed to minimize electrostatic interactions.•The piezoresponse measured by capacitive excitation PFM (ce-PFM) is smaller than conventional PFM.•The domain contrast obtained by ce-PFM is sharper than conventional PFM. Piezoresponse f...
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| Published in | Theoretical and applied mechanics letters Vol. 10; no. 1; pp. 23 - 26 |
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| Main Authors | , , , |
| Format | Journal Article |
| Language | English |
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01.01.2020
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| Abstract | •Capacitive excitation piezoresponse force microscopy (PFM) is developed to minimize electrostatic interactions.•The piezoresponse measured by capacitive excitation PFM (ce-PFM) is smaller than conventional PFM.•The domain contrast obtained by ce-PFM is sharper than conventional PFM.
Piezoresponse force microscopy (PFM) has emerged as one of the most powerful techniques to probe ferroelectric materials at the nanoscale, yet it has been increasingly recognized that piezoresponse measured by PFM is often influenced by electrostatic interactions. In this letter, we report a capacitive excitation PFM (ce-PFM) to minimize the electrostatic interactions. The effectiveness of ce-PFM in minimizing electrostatic interactions is demonstrated by comparing the piezoresponse and the effective piezoelectric coefficient measured by ce-PFM and conventional PFM. The effectiveness is further confirmed through the ferroelectric domain pattern imaged via ce-PFM and conventional PFM in vertical modes, with the corresponding domain contrast obtained by ce-PFM is sharper than conventional PFM. These results demonstrate ce-PFM as an effective tool to minimize the interference from electrostatic interactions and to image ferroelectric domain pattern, and it can be easily implemented in conventional atomic force microscope (AFM) setup to probe true piezoelectricity at the nanoscale. |
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| AbstractList | •Capacitive excitation piezoresponse force microscopy (PFM) is developed to minimize electrostatic interactions.•The piezoresponse measured by capacitive excitation PFM (ce-PFM) is smaller than conventional PFM.•The domain contrast obtained by ce-PFM is sharper than conventional PFM.
Piezoresponse force microscopy (PFM) has emerged as one of the most powerful techniques to probe ferroelectric materials at the nanoscale, yet it has been increasingly recognized that piezoresponse measured by PFM is often influenced by electrostatic interactions. In this letter, we report a capacitive excitation PFM (ce-PFM) to minimize the electrostatic interactions. The effectiveness of ce-PFM in minimizing electrostatic interactions is demonstrated by comparing the piezoresponse and the effective piezoelectric coefficient measured by ce-PFM and conventional PFM. The effectiveness is further confirmed through the ferroelectric domain pattern imaged via ce-PFM and conventional PFM in vertical modes, with the corresponding domain contrast obtained by ce-PFM is sharper than conventional PFM. These results demonstrate ce-PFM as an effective tool to minimize the interference from electrostatic interactions and to image ferroelectric domain pattern, and it can be easily implemented in conventional atomic force microscope (AFM) setup to probe true piezoelectricity at the nanoscale. Piezoresponse force microscopy (PFM) has emerged as one of the most powerful techniques to probe ferroelectric materials at the nanoscale, yet it has been increasingly recognized that piezoresponse measured by PFM is often influenced by electrostatic interactions. In this letter, we report a capacitive excitation PFM (ce-PFM) to minimize the electrostatic interactions. The effectiveness of ce-PFM in minimizing electrostatic interactions is demonstrated by comparing the piezoresponse and the effective piezoelectric coefficient measured by ce-PFM and conventional PFM. The effectiveness is further confirmed through the ferroelectric domain pattern imaged via ce-PFM and conventional PFM in vertical modes, with the corresponding domain contrast obtained by ce-PFM is sharper than conventional PFM. These results demonstrate ce-PFM as an effective tool to minimize the interference from electrostatic interactions and to image ferroelectric domain pattern, and it can be easily implemented in conventional atomic force microscope (AFM) setup to probe true piezoelectricity at the nanoscale. Keywords: Piezoresponse force microscopy, Electrostatic interactions, Capacitive excitation |
| Author | Zhu, Qingfeng Esfahani, Ehsan Nasr Xie, Shuhong Li, Jiangyu |
| Author_xml | – sequence: 1 givenname: Qingfeng surname: Zhu fullname: Zhu, Qingfeng organization: Shenzhen Key Laboratory of Nanobiomechanics, Shenzhen Institutes of Advanced Technology, Chinese Academy of Sciences, Shenzhen 518055, China – sequence: 2 givenname: Ehsan Nasr surname: Esfahani fullname: Esfahani, Ehsan Nasr organization: Shenzhen Key Laboratory of Nanobiomechanics, Shenzhen Institutes of Advanced Technology, Chinese Academy of Sciences, Shenzhen 518055, China – sequence: 3 givenname: Shuhong surname: Xie fullname: Xie, Shuhong email: shxie@xtu.edu.cn organization: Key Laboratory of Low Dimensional Materials and Application Technology of Ministry of Education, and School of Materials Science and Engineering, Xiangtan University, Xiangtan 411105, China – sequence: 4 givenname: Jiangyu surname: Li fullname: Li, Jiangyu email: jjli@uw.edu organization: Shenzhen Key Laboratory of Nanobiomechanics, Shenzhen Institutes of Advanced Technology, Chinese Academy of Sciences, Shenzhen 518055, China |
| BookMark | eNp9kMFq3DAURbVIoWmaH-hKPzDOe7I1HkM2YWjTgYRukrV4lp_CG8aWkc3Qma-PnCldRhuJC-eie76pqyEOrNQPhAIB13f7Yqb-UBgwUAAWAHilrg00dgVl1XxVt9O0h3wsrsumvFb-WQbp5SzDm-YD-znFaaZZvJZh5kR-ljhMOqTY61H4HBNPY05Yh5g86158JnwcT_oopD2N5GWWI2v-mx-04N_Vl0CHiW__3Tfq9dfPl-3v1dOfx9324WnlK4R5hQZrIjAhbJixbYCRauKmbQG6tjNUW6wN-s4b26I1m5yAraxFsnluKG_U7tLbRdq7MUlP6eQiifsIYnpzlPK0AztuqKoQzdp0VVVzaBk2dcslbppQlmhyl7l0LfOmxOF_H4JbTLu9W0y7xbQDdNl0hu4vEOeVR-HkJi88eO4kZbX5G_IZ_g70eY0B |
| CitedBy_id | crossref_primary_10_1002_advs_202003993 crossref_primary_10_1039_D0TC01556C crossref_primary_10_1016_j_apsusc_2021_151281 crossref_primary_10_34133_2021_1519340 |
| Cites_doi | 10.1126/science.1129564 10.1063/1.4891349 10.1016/S0304-3991(99)00134-5 10.1103/RevModPhys.84.119 10.1007/s10832-004-5114-y 10.1126/science.1092508 10.1063/1.4873386 10.1039/C1NR11099C 10.1063/1.4927809 10.1109/TUFFC.2006.170 10.1063/1.4922210 10.1063/1.4901102 10.1063/1.4979015 10.1016/j.cap.2016.12.012 10.1103/PhysRevB.65.125408 10.1021/nl0350837 10.1039/c3nr00770g 10.1088/0953-8984/19/13/132201 10.1088/0957-4484/22/35/355705 10.1063/1.3486226 10.1063/1.2750524 10.1557/PROC-541-617 10.1063/1.4884422 10.1021/acsnano.5b02227 10.1002/adma.201102249 10.1103/PhysRevB.34.5883 10.1063/1.1592307 |
| ContentType | Journal Article |
| Copyright | 2020 The Authors. Published by Elsevier Ltd on behalf of The Chinese Society of Theoretical and Applied Mechanics |
| Copyright_xml | – notice: 2020 The Authors. Published by Elsevier Ltd on behalf of The Chinese Society of Theoretical and Applied Mechanics |
| DBID | 6I. AAFTH AAYXX CITATION DOA |
| DOI | 10.1016/j.taml.2020.01.001 |
| DatabaseName | ScienceDirect Open Access Titles Elsevier:ScienceDirect:Open Access CrossRef Directory of Open Access Journals |
| DatabaseTitle | CrossRef |
| DatabaseTitleList | |
| Database_xml | – sequence: 1 dbid: DOA name: DOAJ Directory of Open Access Journals url: https://www.doaj.org/ sourceTypes: Open Website |
| DeliveryMethod | fulltext_linktorsrc |
| Discipline | Engineering |
| EndPage | 26 |
| ExternalDocumentID | oai_doaj_org_article_e9a4411262d447efbe087be3189f3312 10_1016_j_taml_2020_01_001 S2095034920300052 |
| GroupedDBID | 0R~ 0SF 4.4 457 5VR 5VS 6I. 92E 92I 92Q 93N AACTN AAEDT AAEDW AAFTH AAIKJ AALRI AAXUO ABFTF ABMAC ACGFS ADBBV ADEZE AEXQZ AFTJW AFUIB AGHFR AITUG ALMA_UNASSIGNED_HOLDINGS AMRAJ BCNDV CCEZO CCVFK CHBEP CW9 EBS EJD FA0 FDB GROUPED_DOAJ IPNFZ M41 NCXOZ O9- OK1 RIG RNS ROL SSZ TCJ TGP Y7S -SA -S~ AAXDM AAYXX ADVLN AKRWK CAJEA CITATION Q-- U1G U5K |
| ID | FETCH-LOGICAL-c410t-1217aa02ff8ee1b90e1a7ae9bb00dbd2a751721cdc25b15282a7054551a5020f3 |
| IEDL.DBID | DOA |
| ISSN | 2095-0349 |
| IngestDate | Thu Jul 04 21:11:41 EDT 2024 Fri Aug 23 03:40:16 EDT 2024 Thu Jul 20 20:16:50 EDT 2023 |
| IsDoiOpenAccess | true |
| IsOpenAccess | true |
| IsPeerReviewed | true |
| IsScholarly | true |
| Issue | 1 |
| Keywords | Capacitive excitation Electrostatic interactions Piezoresponse force microscopy |
| Language | English |
| License | http://creativecommons.org/licenses/by-nc-nd/4.0 |
| LinkModel | DirectLink |
| MergedId | FETCHMERGED-LOGICAL-c410t-1217aa02ff8ee1b90e1a7ae9bb00dbd2a751721cdc25b15282a7054551a5020f3 |
| OpenAccessLink | https://doaj.org/article/e9a4411262d447efbe087be3189f3312 |
| PageCount | 4 |
| ParticipantIDs | doaj_primary_oai_doaj_org_article_e9a4411262d447efbe087be3189f3312 crossref_primary_10_1016_j_taml_2020_01_001 elsevier_sciencedirect_doi_10_1016_j_taml_2020_01_001 |
| PublicationCentury | 2000 |
| PublicationDate | January 2020 2020-01-00 2020-01-01 |
| PublicationDateYYYYMMDD | 2020-01-01 |
| PublicationDate_xml | – month: 01 year: 2020 text: January 2020 |
| PublicationDecade | 2020 |
| PublicationTitle | Theoretical and applied mechanics letters |
| PublicationYear | 2020 |
| Publisher | Elsevier Ltd Elsevier |
| Publisher_xml | – name: Elsevier Ltd – name: Elsevier |
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| SSID | ssj0000516393 |
| Score | 2.1876252 |
| Snippet | •Capacitive excitation piezoresponse force microscopy (PFM) is developed to minimize electrostatic interactions.•The piezoresponse measured by capacitive... Piezoresponse force microscopy (PFM) has emerged as one of the most powerful techniques to probe ferroelectric materials at the nanoscale, yet it has been... |
| SourceID | doaj crossref elsevier |
| SourceType | Open Website Aggregation Database Publisher |
| StartPage | 23 |
| SubjectTerms | Capacitive excitation Electrostatic interactions Piezoresponse force microscopy |
| Title | Minimizing electrostatic interactions from piezoresponse force microscopy via capacitive excitation |
| URI | https://dx.doi.org/10.1016/j.taml.2020.01.001 https://doaj.org/article/e9a4411262d447efbe087be3189f3312 |
| Volume | 10 |
| hasFullText | 1 |
| inHoldings | 1 |
| isFullTextHit | |
| isPrint | |
| link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwrV1LS8QwEA6iFz2IT1xf5OBNinm0m_aoooiiB1H0VvKYQoVdZV1F_fXONFnpSS8eG0pSZpJ-k-Sbbxg7KIyuoDI-k6YUGSJUk5U66Mx6nAHe6lJ5Sk6-vhle3OeXj8Vjr9QXccKiPHA03BFUFhFbqqEKeW6gcSBK4-jkrmq0lvHvK4veZiqpeiP00vWyEpSCrPMqZcxEctfUjujeQYlOszNVhJmhUife3wOnHuCcr7DlFCny4_iFq2wOxmtsqacfuM78dTtuR-0XPvBUz4YShFrPSQViEnMWXjmlkPCXFr6eJ5ERCxxDVQ98RGw8ykv55O-t5R6B03dcIg4fPol3b7D787O704ssVU3IfC7FNJO4ybBWqKYpAaSrBEhrLFQOF1hwQVlT0LbPB68Kh-hdYgvGbRg52QIN0uhNNj9-HsMW4wZEkCCVEwrQjaEMhbFDHeTQmyCcHbDDmdXqlyiOUc9YY0812bgmG9dCEnVuwE7IsD9vkrB114DurpO767_cPWDFzC11ihEi9mNX7S-Db__H4DtskbqMJzC7bH46eYM9jEmmbp8tHF_dPlztd9PwG6mP33k |
| link.rule.ids | 315,786,790,870,2115,27957,27958 |
| linkProvider | Directory of Open Access Journals |
| openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Minimizing+electrostatic+interactions+from+piezoresponse+force+microscopy+via+capacitive+excitation&rft.jtitle=Theoretical+and+applied+mechanics+letters&rft.au=Zhu%2C+Qingfeng&rft.au=Esfahani%2C+Ehsan+Nasr&rft.au=Xie%2C+Shuhong&rft.au=Li%2C+Jiangyu&rft.date=2020-01-01&rft.pub=Elsevier+Ltd&rft.issn=2095-0349&rft.volume=10&rft.issue=1&rft.spage=23&rft.epage=26&rft_id=info:doi/10.1016%2Fj.taml.2020.01.001&rft.externalDocID=S2095034920300052 |
| thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=2095-0349&client=summon |
| thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=2095-0349&client=summon |
| thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=2095-0349&client=summon |