Runtime Tracking-based Replication of On-chip Embedded Software using Transfer Function Learning for Dust Particle Sensing Systems

• Published in: IEEE access Vol. 11; p. 1
• Main Authors: Lee, Seungmin, Kwon, Jisu, Park, Daejin
• Format: Journal Article
• Language: English
• Published: Piscataway IEEE 01.01.2023; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Algorithms; Cost analysis; Decomposition; Digital twin; Digital twins; Digitization; Dust; Electronic devices; Embedded systems; Embedded test; Lightweight; Particle sensing; Particulate matter; Power consumption; Power management; Sensors; Singular-value decomposition; Transfer functions

A digital twin is a widely used method that uses digitized simulations of the real-world characteristics because it is effective in predicting results at a low cost. In digital twin analysis, the transfer function between the input and output data is an important research subject. In this study, we...