A concise tutorial review of TOF-SIMS based molecular and cellular imaging

This concise tutorial review provides a description of the current state of the art in the application of time-of flight based secondary ion mass spectrometry (TOF-SIMS) in the field of molecular and cellular imaging. The application of TOF-SIMS requires a choice of the appropriate beam combined wit...

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Published inJournal of analytical atomic spectrometry Vol. 34; no. 11; pp. 2217 - 2228
Main Authors Massonnet, Philippe, Heeren, Ron M. A
Format Journal Article
LanguageEnglish
Published London Royal Society of Chemistry 01.11.2019
Subjects
Identification methods
Imaging
Ions
Secondary ion mass spectrometry
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ISSN0267-9477
1364-5544
DOI10.1039/c9ja00164f

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Summary:This concise tutorial review provides a description of the current state of the art in the application of time-of flight based secondary ion mass spectrometry (TOF-SIMS) in the field of molecular and cellular imaging. The application of TOF-SIMS requires a choice of the appropriate beam combined with a signal enhancement method depending on the surface under investigation. The types of detected molecules and methods for molecular identification in SIMS are strongly determined by this combination of ionization method and sample preparation. The use of TOF-SIMS for single cell and three-dimensional imaging will be discussed in the context of selected applications. Finally we will discuss an outlook on the application of the TOF-SIMS technology in a multimodal molecular imaging context. This concise tutorial review provides a description of the current state of the art in the application of time-of flight based secondary ion mass spectrometry (TOF-SIMS) in the field of molecular and cellular imaging.
Bibliography:Dr Philippe Massonnet obtained his M.Sc. degree in Chemistry in 2012 and PhD degree in 2017 at the University of Liège (Belgium). His PhD thesis was performed under the supervision of Prof. De Pauw and Prof. Quinton in the Mass Spectrometry Laboratory and his research focused on the development of new mass spectrometry-based characterization techniques of disulfide-bonded peptides. He is currently a post-doctoral fellow at the Maastricht MultiModal Molecular Imaging (M4I) institute in the mass spectrometry imaging division (Prof. Heeren) at Maastricht University (Netherlands) and his research interest includes SIMS instrumental and method developments for biological sample analysis.
Prof. Dr Ron M. A. Heeren (1965) is a distinguished professor and Limburg Chair at the University of Maastricht. He is the director of the Maastricht MultiModal Molecular Imaging (M4I) Institute and heads the division of imaging mass spectrometry. He has developed innovative approaches towards high spatial resolution and high throughput molecular imaging technologies to study the complexity of interfaces. He has a strong interest in translational molecular imaging for tissue typing in personalized medicine.
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ISSN:0267-9477
1364-5544
DOI:10.1039/c9ja00164f