APA (7th ed.) Citation

Banik, S., Rogers, M., Mahajan, S. M., Emeghara, C. M., Banik, T., & Craven, R. (2024). Survey on Vulnerability Testing in the Smart Grid. IEEE access, 12, 119146-119173. https://doi.org/10.1109/ACCESS.2024.3449642

Chicago Style (17th ed.) Citation

Banik, Shampa, Michael Rogers, Satish M. Mahajan, Chikezie M. Emeghara, Trapa Banik, and Robert Craven. "Survey on Vulnerability Testing in the Smart Grid." IEEE Access 12 (2024): 119146-119173. https://doi.org/10.1109/ACCESS.2024.3449642.

MLA (9th ed.) Citation

Banik, Shampa, et al. "Survey on Vulnerability Testing in the Smart Grid." IEEE Access, vol. 12, 2024, pp. 119146-119173, https://doi.org/10.1109/ACCESS.2024.3449642.