From Sample Poverty to Rich Feature Learning: A New Metric Learning Method for Few-Shot Classification - Zhang, Lei; Lin, Yiting; Yang, Xinyu; Chen, Tingting; Cheng, Xiyuan; Cheng, Wenbin (IEEE access, 2024)
Keywords: Classification; Computer vision; Data models; Deep learning; Effectiveness; Feature extraction; Few shot learning; Image Classification; Image enhancement; Machine learning; Measurement; Metric Learning; Representations; Task analysis; Training