Speedup Two-Class Supervised Outlier Detection

• Published in: IEEE access Vol. 6; pp. 63923 - 63933
• Main Authors: Yi, Yugen, Zhou, Wei, Shi, Yanjiao, Dai, Jiangyan
• Format: Journal Article
• Language: English
• Published: Piscataway IEEE 2018; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Anomaly detection; critical sample; Data analysis; Data mining; Lagrange multiplier; Machine learning; nearest neighbors’ distribution; Outliers (statistics); Performance degradation; Quadratic programming; Static VAr compensators; Supervised outlier detection; Support vector machines; Training

Outlier detection is an important topic in the community of data mining and machine learning. In two-class supervised outlier detection, it needs to solve a large quadratic programming whose size is twice the number of samples in the training set. Thus, training two-class supervised outlier detectio...