Speedup Two-Class Supervised Outlier Detection - Yi, Yugen; Zhou, Wei; Shi, Yanjiao; Dai, Jiangyan (IEEE access, 2018)
Keywords: Anomaly detection; critical sample; Data analysis; Data mining; Lagrange multiplier; Machine learning; nearest neighbors’ distribution; Outliers (statistics); Performance degradation; Quadratic programming; Static VAr compensators; Supervised outlier detection; Support vector machines; Training