Adversarial deception against SAR target recognition network

• Published in: IEEE journal of selected topics in applied earth observations and remote sensing Vol. 15; p. 1
• Main Authors: Zhang, Fan, Tianying, Meng, Xiang, Deliang, Ma, Fei, Sun, Xiaokun, Zhou, Yongsheng
• Format: Journal Article
• Language: English
• Published: Piscataway IEEE 01.01.2022; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Adversarial attack; Algorithms; Artificial neural networks; Automatic target recognition; automatic target recognition (ATR); Datasets; Deception; Deep learning; Image quality; Linear programming; Machine learning; Methods; Neural networks; Perturbation; Perturbation methods; Quality assessment; Radar polarimetry; SAR (radar); Synthetic aperture radar; Synthetic aperture radar (SAR); Target recognition

Synthetic Aperture Radar (SAR) automatic target recognition (ATR) technology is one of the key technologies to achieve intelligent interpretation for SAR images. With the rapid development of deep learning, deep neural networks have been successively used in SAR ATR and show priority in comparison w...