Power/Energy Minimization Techniques for Variability-Aware High-Performance 16-nm 6T-SRAM - Samandari-Rad, Jeren; Hughey, Richard (IEEE access, 2016)
Keywords: 16-nm; 6T-SRAM; aging; Delay; Electromigration; Empirical analysis; Energy; Energy consumption; Energy efficiency; Energy management; energy-delay-product; IR drop; leakage current; Leakage currents; memory errors; Memory management; NBTI; Optimization; optimum architecture; power; Power system reliability; reliability; SRAM; Temperature; Temperature measurement; type of variations; variability; yield; IR drop; multi-threshold CMOS; Temperature; VLSI; high speed; type of variations; reliability; static random access memory; leakage current; 16-nm; electromigration; variability; NBTI; 6T-SRAM; energy-delay-product; memory errors; process variations; energy efficiency; yield; optimum architecture; low power; aging; RAM