On the Suitability of Augmented Reality for Safe Experiments on Radioactive Materials in Physics Educational Applications
Laboratory experiences have proved to be a key moment of the educational path in most of the so-called Sciences, Technology, Engineering and Mathematics (STEM) subjects. Having the opportunity of practicing on actual experiments about the theoretical knowledge achieved during the classroom lectures...
Saved in:
Published in | IEEE access Vol. 10; pp. 54185 - 54196 |
---|---|
Main Authors | , , , , , |
Format | Journal Article |
Language | English |
Published |
Piscataway
IEEE
2022
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subjects | |
Online Access | Get full text |
Cover
Loading…
Abstract | Laboratory experiences have proved to be a key moment of the educational path in most of the so-called Sciences, Technology, Engineering and Mathematics (STEM) subjects. Having the opportunity of practicing on actual experiments about the theoretical knowledge achieved during the classroom lectures is a fundamental step from a didactic point of view. However, lab activities could be forbidden in the presence of tests characterized by safety issues, thus limiting students' cultural growth; this is particularly true for physics experiments involving radioactive materials, sources of dangerous radiations. To face the considered problems, the authors propose hereinafter a mixed-reality solution involving augmented reality (AR) at students-side and actual instrumentation at laboratory-side. It is worth noting that the proposed solution can be applied for any type of experiment involving the remote control of measurement instruments and generic risk conditions (physical, chemical or biological). As for the considered case study on gamma radiation measurements, an ad-hoc AR application along with a microcontroller-based prototype allows students, located in a safe classroom, to (i) control distance and orientation of a remote actual detector with respect to different radioactive sources and (ii) retrieve and display on their smartphones the corresponding energy spectrum. The communication between classroom equipment and remote laboratory is carried out by means of enabling technologies typical of Internet of Things paradigm, thus making it possible a straightforward integration of the measurement results in cloud environment as dashboard, storage or processing. |
---|---|
AbstractList | Laboratory experiences have proved to be a key moment of the educational path in most of the so-called Sciences, Technology, Engineering and Mathematics (STEM) subjects. Having the opportunity of practicing on actual experiments about the theoretical knowledge achieved during the classroom lectures is a fundamental step from a didactic point of view. However, lab activities could be forbidden in the presence of tests characterized by safety issues, thus limiting students' cultural growth; this is particularly true for physics experiments involving radioactive materials, sources of dangerous radiations. To face the considered problems, the authors propose hereinafter a mixed-reality solution involving augmented reality (AR) at students-side and actual instrumentation at laboratory-side. It is worth noting that the proposed solution can be applied for any type of experiment involving the remote control of measurement instruments and generic risk conditions (physical, chemical or biological). As for the considered case study on gamma radiation measurements, an ad-hoc AR application along with a microcontroller-based prototype allows students, located in a safe classroom, to (i) control distance and orientation of a remote actual detector with respect to different radioactive sources and (ii) retrieve and display on their smartphones the corresponding energy spectrum. The communication between classroom equipment and remote laboratory is carried out by means of enabling technologies typical of Internet of Things paradigm, thus making it possible a straightforward integration of the measurement results in cloud environment as dashboard, storage or processing. |
Author | Schiano Lo Moriello, Rosario Bonavolonta, Francesco Gloria, Antonio Caputo, Enzo De Alteriis, Giorgio Liccardo, Annalisa |
Author_xml | – sequence: 1 givenname: Rosario orcidid: 0000-0003-4875-2845 surname: Schiano Lo Moriello fullname: Schiano Lo Moriello, Rosario email: rschiano@unina.it organization: Dipartimento di Ingegneria Industriale, Universitá degli Studi di Napoli Federico II, Naples, Italy – sequence: 2 givenname: Annalisa orcidid: 0000-0003-1270-4948 surname: Liccardo fullname: Liccardo, Annalisa organization: Dipartimento di Ingegneria Elettrica e delle Tecnologie dell'Informazione, Universitá degli Studi di Napoli Federico II, Naples, Italy – sequence: 3 givenname: Francesco orcidid: 0000-0003-0666-0942 surname: Bonavolonta fullname: Bonavolonta, Francesco organization: Dipartimento di Ingegneria Elettrica e delle Tecnologie dell'Informazione, Universitá degli Studi di Napoli Federico II, Naples, Italy – sequence: 4 givenname: Enzo orcidid: 0000-0003-0434-1585 surname: Caputo fullname: Caputo, Enzo organization: Dipartimento di Ingegneria Industriale, Universitá degli Studi di Napoli Federico II, Naples, Italy – sequence: 5 givenname: Antonio orcidid: 0000-0001-5233-5687 surname: Gloria fullname: Gloria, Antonio organization: Institute of Polymers, Composites and Biomaterials, National Research Council of Italy, Naples, Italy – sequence: 6 givenname: Giorgio orcidid: 0000-0002-4460-6640 surname: De Alteriis fullname: De Alteriis, Giorgio organization: Dipartimento di Ingegneria Industriale, Universitá degli Studi di Napoli Federico II, Naples, Italy |
BookMark | eNqFUcFu3CAQtapUaprkC3JB6nm3YGwPPq5W2zZSqkTZ3NEYDwkr17iAq-7fl42jqOqlXIA3771heB-Ls9GPVBTXgq-F4O3nzXa72-_XJS_LtRRQq6Z9V5yXomlXspbN2V_nD8VVjAeel8pQDefF8W5k6ZnYfnYJOze4dGTess389IPGRD17IHwBrQ9sj5bY7vdEwZ2qkfmRPWDvPJrkfhH7jimXcIjMjez--RidiWzXzwaT8yMObDNNg1tu8bJ4bzOVrl73i-Lxy-5x-211e_f1Zru5XZmKq7QSBLKT0PdQirqFhiSVRkmrOmk4Wd5X3EJluK2hUtACKVRd3VskaDJPXhQ3i23v8aCn_HIMR-3R6RfAhyeNITkzkDakJFbYSpSq6qBuVSlA1NY0QkBnRfb6tHhNwf-cKSZ98HPIg0VdNlBypaCBzJILywQfYyD71lVwfUpML4npU2L6NbGsav9RmZzI6adSQDf8R3u9aB0RvXVrIY8AIP8Ao1Wm5w |
CODEN | IAECCG |
CitedBy_id | crossref_primary_10_1088_1361_6404_ad74b9 crossref_primary_10_1016_j_measen_2024_101321 crossref_primary_10_1088_1361_6404_ad0e84 crossref_primary_10_3390_educsci14070760 |
Cites_doi | 10.11648/j.ijrse.20140303.13 10.3991/ijet.v15i10.12703 10.1145/1507713.1507717 10.14445/22312803/IJCTT-V45P109 10.3390/app11020762 10.1016/j.iheduc.2015.01.002 10.21009/1.06106 10.1016/j.amjsurg.2006.06.042 10.1016/S0031-8914(54)90810-1 10.1016/j.entcs.2019.04.012 10.1016/j.chb.2020.106418 10.1016/j.sab.2010.12.011 10.1109/ACCESS.2020.3048708 10.1038/s41598-020-66832-x 10.1088/1742-6596/1462/1/012066 10.1007/s11412-012-9150-3 10.1109/ACCESS.2022.3145991 10.3390/app9194019 10.31812/123456789/2660 10.1016/j.compedu.2018.05.002 10.1007/s11528-012-0559-3 10.1080/00401706.1962.10490040 10.1109/ACCESS.2020.3000990 10.3390/app11052335 10.1109/ECTICon.2015.7207125 10.4236/jss.2016.48017 10.1016/j.iheduc.2015.04.003 10.5539/ies.v8n13p1 10.1109/VRW50115.2020.00231 10.14527/pegegog.2014.004 10.1145/3290605.3300774 10.1089/end.2006.20.986 |
ContentType | Journal Article |
Copyright | Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2022 |
Copyright_xml | – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2022 |
DBID | 97E ESBDL RIA RIE AAYXX CITATION 7SC 7SP 7SR 8BQ 8FD JG9 JQ2 L7M L~C L~D DOA |
DOI | 10.1109/ACCESS.2022.3175869 |
DatabaseName | IEEE All-Society Periodicals Package (ASPP) 2005–Present IEEE Xplore Open Access Journals IEEE All-Society Periodicals Package (ASPP) 1998–Present IEEE Xplore CrossRef Computer and Information Systems Abstracts Electronics & Communications Abstracts Engineered Materials Abstracts METADEX Technology Research Database Materials Research Database ProQuest Computer Science Collection Advanced Technologies Database with Aerospace Computer and Information Systems Abstracts Academic Computer and Information Systems Abstracts Professional DOAJ Directory of Open Access Journals |
DatabaseTitle | CrossRef Materials Research Database Engineered Materials Abstracts Technology Research Database Computer and Information Systems Abstracts – Academic Electronics & Communications Abstracts ProQuest Computer Science Collection Computer and Information Systems Abstracts Advanced Technologies Database with Aerospace METADEX Computer and Information Systems Abstracts Professional |
DatabaseTitleList | Materials Research Database |
Database_xml | – sequence: 1 dbid: DOA name: DOAJ Directory of Open Access Journals url: https://www.doaj.org/ sourceTypes: Open Website – sequence: 2 dbid: RIE name: IEEE Electronic Library (IEL) url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/ sourceTypes: Publisher |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Engineering Physics Education |
EISSN | 2169-3536 |
EndPage | 54196 |
ExternalDocumentID | oai_doaj_org_article_ce83a4a93a384b759821715fc6117bf1 10_1109_ACCESS_2022_3175869 9775977 |
Genre | orig-research |
GroupedDBID | 0R~ 4.4 5VS 6IK 97E AAJGR ABAZT ABVLG ACGFS ADBBV AGSQL ALMA_UNASSIGNED_HOLDINGS BCNDV BEFXN BFFAM BGNUA BKEBE BPEOZ EBS EJD ESBDL GROUPED_DOAJ IPLJI JAVBF KQ8 M43 M~E O9- OCL OK1 RIA RIE RNS AAYXX CITATION RIG 7SC 7SP 7SR 8BQ 8FD JG9 JQ2 L7M L~C L~D |
ID | FETCH-LOGICAL-c408t-1e73b37dd7215976e3e2c83f8b3c0ef0d40f74c0f5748797e8a8b5dfae76c833 |
IEDL.DBID | RIE |
ISSN | 2169-3536 |
IngestDate | Wed Aug 27 01:29:50 EDT 2025 Mon Jun 30 05:57:24 EDT 2025 Tue Jul 01 04:21:10 EDT 2025 Thu Apr 24 23:12:30 EDT 2025 Wed Aug 27 02:24:38 EDT 2025 |
IsDoiOpenAccess | true |
IsOpenAccess | true |
IsPeerReviewed | true |
IsScholarly | true |
Language | English |
License | https://creativecommons.org/licenses/by/4.0/legalcode |
LinkModel | DirectLink |
MergedId | FETCHMERGED-LOGICAL-c408t-1e73b37dd7215976e3e2c83f8b3c0ef0d40f74c0f5748797e8a8b5dfae76c833 |
Notes | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 14 |
ORCID | 0000-0003-4875-2845 0000-0001-5233-5687 0000-0003-0666-0942 0000-0003-0434-1585 0000-0003-1270-4948 0000-0002-4460-6640 |
OpenAccessLink | https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/document/9775977 |
PQID | 2672088767 |
PQPubID | 4845423 |
PageCount | 12 |
ParticipantIDs | doaj_primary_oai_doaj_org_article_ce83a4a93a384b759821715fc6117bf1 proquest_journals_2672088767 crossref_primary_10_1109_ACCESS_2022_3175869 crossref_citationtrail_10_1109_ACCESS_2022_3175869 ieee_primary_9775977 |
ProviderPackageCode | CITATION AAYXX |
PublicationCentury | 2000 |
PublicationDate | 20220000 2022-00-00 20220101 2022-01-01 |
PublicationDateYYYYMMDD | 2022-01-01 |
PublicationDate_xml | – year: 2022 text: 20220000 |
PublicationDecade | 2020 |
PublicationPlace | Piscataway |
PublicationPlace_xml | – name: Piscataway |
PublicationTitle | IEEE access |
PublicationTitleAbbrev | Access |
PublicationYear | 2022 |
Publisher | IEEE The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher_xml | – name: IEEE – name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
References | ref13 ref12 ref15 (ref49) 2017 ref52 ref11 ref17 ref16 ref19 ref18 (ref46) 2016 (ref56) 2011 Billinghurst (ref14) 2002; 12 (ref37) 2020 Liarokapis (ref10) 2004; 3 Kumaran (ref41) 1985 Ashton (ref3) 2009; 22 Vermesan (ref4) 2013 ref42 ref44 (ref53) 2015 ref43 (ref50) 2020 (ref48) 2018 Bianco (ref36) 2018 ref8 ref7 ref9 ref6 Rydin (ref45) 2994 ref40 Hillar (ref35) 2017 Nelson (ref39) 1991; 2 (ref51) 2021 ref31 ref30 ref33 ref32 ref2 ref38 (ref34) 2016 (ref54) 2020 Vermesan (ref5) 2014; 29 ref24 Ejiwale (ref1) 2012; 13 ref23 ref26 ref25 ref20 ref22 ref21 ref28 ref27 ref29 (ref55) 2015 (ref47) 2017 |
References_xml | – year: 2016 ident: ref46 article-title: X-NUCLEO-53L0A1 ranging and gesture detection sensor expansion board based on VL53L0X for STM32 Nucleo, datasheet – ident: ref38 doi: 10.11648/j.ijrse.20140303.13 – year: 2011 ident: ref56 article-title: Faro edge scanarm laser line scanning with a competitive advantage, datasheet – ident: ref26 doi: 10.3991/ijet.v15i10.12703 – ident: ref20 doi: 10.1145/1507713.1507717 – volume-title: Caen, I-Spector Digital ident: ref52 – ident: ref11 doi: 10.14445/22312803/IJCTT-V45P109 – volume-title: MQTT Essentials—A Lightweight IoT Protocol year: 2017 ident: ref35 – ident: ref27 doi: 10.3390/app11020762 – volume: 12 start-page: 1 issue: 5 year: 2002 ident: ref14 article-title: Augmented reality in education publication-title: New Horizons Learn. – volume: 29 volume-title: Internet of Things-From Research and Innovation to Market Deployment year: 2014 ident: ref5 – volume: 3 start-page: 11 issue: 1 year: 2004 ident: ref10 article-title: Web3D and augmented reality to support engineering education publication-title: World Trans. Eng. Technol. Educ. – ident: ref16 doi: 10.1016/j.iheduc.2015.01.002 – volume-title: Information Technology—Message Queuing Telemetry Transport (MQTT) v3.1.1 year: 2016 ident: ref34 – ident: ref7 doi: 10.21009/1.06106 – volume: 13 start-page: 1 issue: 3 year: 2012 ident: ref1 article-title: Facilitating teaching and learning across STEM fields publication-title: J. STEM Educ., Innov. Res. – ident: ref33 doi: 10.1016/j.amjsurg.2006.06.042 – ident: ref44 doi: 10.1016/S0031-8914(54)90810-1 – ident: ref9 doi: 10.1016/j.entcs.2019.04.012 – volume: 22 start-page: 97 issue: 7 year: 2009 ident: ref3 article-title: That ‘Internet of Things’ thing publication-title: RFID J. – year: 2020 ident: ref50 article-title: STM32 Nucleo-64 boards (MB1136), datasheet – ident: ref31 doi: 10.1016/j.chb.2020.106418 – ident: ref43 doi: 10.1016/j.sab.2010.12.011 – ident: ref18 doi: 10.1109/ACCESS.2020.3048708 – year: 2018 ident: ref48 article-title: World’s smallest time-of-flight ranging and gesture detection sensor, datasheet – year: 2994 ident: ref45 article-title: Resolution, efficiency and background effects in semiconductor sandwich fast neutron spectrometers. EUR 2994 – year: 2017 ident: ref49 article-title: iNEMO inertial module: Always-on 3D accelerometer and 3D gyroscope, datasheet – ident: ref42 doi: 10.1038/s41598-020-66832-x – ident: ref12 doi: 10.1088/1742-6596/1462/1/012066 – ident: ref25 doi: 10.1007/s11412-012-9150-3 – ident: ref17 doi: 10.1109/ACCESS.2022.3145991 – year: 2021 ident: ref51 article-title: ESP32-WROOM-32D & ESP32-WROOM-32U, datasheet – ident: ref24 doi: 10.3390/app9194019 – volume-title: The Benefits of Risk-Taking in the Classroom year: 2020 ident: ref37 – ident: ref30 doi: 10.31812/123456789/2660 – year: 2015 ident: ref53 article-title: Fully integrated microstepping motor driver, datasheet – ident: ref8 doi: 10.1016/j.compedu.2018.05.002 – volume-title: A Gamma-Spectrometer for Determination of Density Distribution and Moisture Distribution in Building Materials year: 1985 ident: ref41 – volume-title: Why Taking risks in the Classroom Pays off for Students- and Teachers year: 2018 ident: ref36 – year: 2017 ident: ref47 article-title: Getting started with the X-NUCLEO-IKS01A2 motion MEMS and environmental sensor expansion board for STM32 Nucleo, datasheet – ident: ref28 doi: 10.1007/s11528-012-0559-3 – ident: ref40 doi: 10.1080/00401706.1962.10490040 – ident: ref19 doi: 10.1109/ACCESS.2020.3000990 – ident: ref29 doi: 10.3390/app11052335 – ident: ref6 doi: 10.1109/ECTICon.2015.7207125 – ident: ref2 doi: 10.4236/jss.2016.48017 – ident: ref15 doi: 10.1016/j.iheduc.2015.04.003 – ident: ref13 doi: 10.5539/ies.v8n13p1 – ident: ref21 doi: 10.1109/VRW50115.2020.00231 – volume: 2 start-page: 27 year: 1991 ident: ref39 article-title: Gamma-ray interactions with matter publication-title: Passive Nondestruct. Anal. Nucl. Mater. – volume-title: Internet of Things: Converging Technologies for Smart Environments and Integrated Ecosystems year: 2013 ident: ref4 – ident: ref23 doi: 10.14527/pegegog.2014.004 – ident: ref22 doi: 10.1145/3290605.3300774 – year: 2015 ident: ref55 article-title: Stepper motor driver expansion board based on L6474 for STM32 Nucleo, datasheet – ident: ref32 doi: 10.1089/end.2006.20.986 – volume-title: Motion King 17HS Stepper Motor 42 mm 1.8 Degree year: 2020 ident: ref54 |
SSID | ssj0000816957 |
Score | 2.2934415 |
Snippet | Laboratory experiences have proved to be a key moment of the educational path in most of the so-called Sciences, Technology, Engineering and Mathematics (STEM)... |
SourceID | doaj proquest crossref ieee |
SourceType | Open Website Aggregation Database Enrichment Source Index Database Publisher |
StartPage | 54185 |
SubjectTerms | Augmented reality Classrooms Communications equipment Control equipment Detectors Education Energy spectra Experiments Gamma rays Instruments Internet of Things Laboratories Measuring instruments Microcontrollers Mixed reality mixed-reality education MQTT protocol Physics physics experiments radiation measurements Radioactive materials Remote control Remote laboratories remote laboratory reverse engineering Smartphones Students Temperature sensors Training |
SummonAdditionalLinks | – databaseName: DOAJ Directory of Open Access Journals dbid: DOA link: http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwrV1Na9wwEBUlp_RQmqSl2yZBhxzjxrIkj3zcLBtCYBNItpCb0GcJFG_J7h7y7zuSvcZQSC65GtmWNOOZ9-ThDSFnFpOuNIwX0DS2EEbGwoAKBbOeQXCl9SYd6C9u6-tf4uZRPo5afaWasE4euNu4CxcUN8I03HAlLCS9OQZMRlczBjZm4oM5b0SmcgxWrG4k9DJDrGwuprMZrggJYVX9TDlTpRLnUSrKiv19i5X_4nJONlefyaceJdJpN7sD8iG0h-TjSDvwiLzctRTBG33YIrvPFa4vdBXpdPs7y2x6eh8yxKaISumDiYHOBzH_NV219N74p5XJ4Y4uzKbzRPrU0lwU6tZ0qP1IMxn95_5Cllfz5ey66PsoFE6UalOwANxy8B7ZHvKHOvBQOcWjstyVIZZelBGEK6MEpC8NBGWUlT6aADWO41_JXrtqwzdCrZJeJo0xEZBZ2MqoJogKPNIipIngJqTa7ah2vcZ4anXxR2euUTa6M4NOZtC9GSbkfLjpbyex8frwy2SqYWjSx84X0Gt07zX6La-ZkKNk6OEhiIKTEN-EHO8Mr_tvea2rGqoUi2v4_h6v_kH203K6Y5xjsrd53oYTBDYbe5p9-B9pTvJD priority: 102 providerName: Directory of Open Access Journals |
Title | On the Suitability of Augmented Reality for Safe Experiments on Radioactive Materials in Physics Educational Applications |
URI | https://ieeexplore.ieee.org/document/9775977 https://www.proquest.com/docview/2672088767 https://doaj.org/article/ce83a4a93a384b759821715fc6117bf1 |
Volume | 10 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1La9wwEB6SQKE99JG0dNs06NBjvLEs25KP2yUhFLaFJIXchB6jsjTYpWsfkl8fSdaapS2lN2NkW2LGM_ONRt8AfNTe6VaKsow3jc5KVblMcYEZ1ZZyNLm2KiT0V1_qy2_l59vqdg9Op7MwiBiLz3AeLuNevu3MEFJlZz5WCXRp-7Dvgdt4VmvKp4QGEk3FE7EQzZuzxXLp1-AhYFHMg5cUoah5x_lEjv7UVOUPSxzdy8ULWG0nNlaV_JgPvZ6bh984G_935i_heYozyWJUjFewh-0hPNthHzyEJ7H602yO4P5rS3wgSK6HdT_ydt-TzpHF8D1SdlpyhTFcJz7CJdfKITmfGgNsSNeSK2XXnYqmk6xUP2o1WbckfYJMdSRhTjt75q_h5uL8ZnmZpZ4MmSlz0WcUOdOMW-uRo19RjQwLI5gTmpkcXW7L3PHS5K7iHgo1HIUSurJOIa_9OPYGDtquxbdAtKhsFfjKSvQoRRdKNFgW3HqI5SEnNzMotrKSJvGVh7YZdzLilryRo4BlELBMAp7B6fTQz5Gu49_DPwUlmIYGru14wwtPpl9XGhRMlaphiolS88B4SDmtnKkp5drRGRwFgU8vSbKewfFWpWSyCxtZ1LwIdr3m7_7-1Ht4GiY4JnmO4aD_NeAHH_b0-iSmC06i1j8CNlEAng |
linkProvider | IEEE |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1Lb9QwEB6VIgQceLQgFgr4wLHZxnEcO8dl1WqBbpHaRerN8rNagRLEJofy67Edb7QChLhFkZ2MNeN5efwNwDvljS6VmGSsrlVWSuoyybjNsDKYWZ0rI0NCf3lRLb6UH6_p9R4cj3dhrLWx-MxOw2M8yzet7kOq7MT7KgEu7Q7c9Xaf4uG21phRCS0kasoStBDO65PZfO5X4YPAopgGO8lDWfOO-Yko_amtyh-6OBqYs8ew3JI21JV8nfadmuqfv6E2_i_tT-BR8jTRbBCNp7BnmwN4uIM_eAD3Yv2n3hzC7ecGeVcQXfXrbkDuvkWtQ7P-JoJ2GnRpo8OOvI-LrqSz6HRsDbBBbYMupVm3MipPtJTdINdo3aD0CzRWkgSadk7Nn8Hq7HQ1X2SpK0Omy5x3GbaMKMKM8bGjX1FliS00J44ronPrclPmjpU6d5T5YKhmlkuuqHHSssqPI89hv2kb-wKQ4tTQgFhWWh-nqELy2pYFMz7I8kEn0xMotrwSOiGWh8YZ30SMXPJaDAwWgcEiMXgCx-Ok7wNgx7-Hvw9CMA4NaNvxhWeeSJtXaMuJLGVNJOGlYgHzEDNMna4wZsrhCRwGho8fSbyewNFWpETSDBtRVKwImr1iL_8-6y3cX6yW5-L8w8WnV_AgEDukfI5gv_vR29feCerUmyj7vwCryQLy |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=On+the+Suitability+of+Augmented+Reality+for+Safe+Experiments+on+Radioactive+Materials+in+Physics+Educational+Applications&rft.jtitle=IEEE+access&rft.au=Schiano+Lo+Moriello%2C+Rosario&rft.au=Liccardo%2C+Annalisa&rft.au=Bonavolonta%2C+Francesco&rft.au=Caputo%2C+Enzo&rft.date=2022&rft.pub=IEEE&rft.eissn=2169-3536&rft.volume=10&rft.spage=54185&rft.epage=54196&rft_id=info:doi/10.1109%2FACCESS.2022.3175869&rft.externalDocID=9775977 |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=2169-3536&client=summon |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=2169-3536&client=summon |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=2169-3536&client=summon |