Simulation of the temperature field distribution in medium-voltage vacuum interrupter and experimental verification

The temperature field distribution in the medium-voltage vacuum interrupter decides the thermal stability of it. In this paper, the simulation model of a kind of 12kV/3150A/40kA medium-voltage vacuum interrupter is constructed, and conductive bridge model is used. This paper simulates current contra...

Full description

Saved in:
Bibliographic Details
Published inIOP conference series. Materials Science and Engineering Vol. 292; no. 1; pp. 12042 - 12051
Main Authors Sun, W, Liu, H L, Cai, Y G, Li, Y L, Zhou, H Y, Zhou, Y
Format Journal Article
LanguageEnglish
Published Bristol IOP Publishing 01.01.2018
Subjects
Online AccessGet full text

Cover

Loading…
Abstract The temperature field distribution in the medium-voltage vacuum interrupter decides the thermal stability of it. In this paper, the simulation model of a kind of 12kV/3150A/40kA medium-voltage vacuum interrupter is constructed, and conductive bridge model is used. This paper simulates current contraction and Joule heating between contacts, and solves relevant problems using the function of the thermal-electrical coupling in the finite element software ANSYS. Steady-state temperature rise of vacuum interrupter at rated current and transient temperature rise of vacuum interrupter at short-time withstand current are calculated. Influence of the contact situation on vacuum interrupter temperature rise is analyzed. Steady-state temperature rise experiments for the interrupter are carried out, and experiment results verify the accuracy of simulation results. The results are useful in the designing and optimizing of medium-voltage vacuum interrupter.
AbstractList The temperature field distribution in the medium-voltage vacuum interrupter decides the thermal stability of it. In this paper, the simulation model of a kind of 12kV/3150A/40kA medium-voltage vacuum interrupter is constructed, and conductive bridge model is used. This paper simulates current contraction and Joule heating between contacts, and solves relevant problems using the function of the thermal-electrical coupling in the finite element software ANSYS. Steady-state temperature rise of vacuum interrupter at rated current and transient temperature rise of vacuum interrupter at short-time withstand current are calculated. Influence of the contact situation on vacuum interrupter temperature rise is analyzed. Steady-state temperature rise experiments for the interrupter are carried out, and experiment results verify the accuracy of simulation results. The results are useful in the designing and optimizing of medium-voltage vacuum interrupter.
Author Sun, W
Liu, H L
Cai, Y G
Zhou, Y
Li, Y L
Zhou, H Y
Author_xml – sequence: 1
  givenname: W
  surname: Sun
  fullname: Sun, W
  email: sunwei19850525@163.com
  organization: Electric Power Research Institute of State Grid Heilongjiang Electric Power Company Limited
– sequence: 2
  givenname: H L
  surname: Liu
  fullname: Liu, H L
  organization: State Grid Heilongjiang Electric Power Company Limited
– sequence: 3
  givenname: Y G
  surname: Cai
  fullname: Cai, Y G
  organization: State Grid Heilongjiang Electric Power Company Limited
– sequence: 4
  givenname: Y L
  surname: Li
  fullname: Li, Y L
  organization: State Grid Heilongjiang Electric Power Equipment and Materials Company , )
– sequence: 5
  givenname: H Y
  surname: Zhou
  fullname: Zhou, H Y
  organization: Electric Power Research Institute of State Grid Heilongjiang Electric Power Company Limited
– sequence: 6
  givenname: Y
  surname: Zhou
  fullname: Zhou, Y
  organization: Electric Power Research Institute of State Grid Heilongjiang Electric Power Company Limited
BookMark eNqFkE1LAzEQhoNU0Fb_ggS8eFmbpEl29yhSP6DioQrewu5moin7ZTYp-u9NW6kIgpdkYJ55Z3jGaNR2LSB0RsklJVk2palIkyzPX6YsZ1M6JZQRzg7Q8b4x2tcZPULjYVgRIlPOyTEalrYJdeFt1-LOYP8G2EPTgyt8cICNhVpjbQfvbBm2lG1xA9qGJll3tS9eAa-LKoQmNjw4F_r44qLVGD5ijG2g9UWN17E0ttouOkGHpqgHOP3-J-j5Zv50fZcsHm_vr68WScVJ6hMDQESZsjTPOStlmekZNxo0lbLkhjNZMsEJhYqSWWpmDGSeMmE0r3IKUpvZBJ3vcnvXvQcYvFp1wbVxpWJCSCGpEDxSckdVrhsGB0b18erCfSpK1Eaw2rhTG48qClZU7QTHwYvdoO36n-SH5fwXpvrtJewP9J_8L97Jj1w
CitedBy_id crossref_primary_10_1016_j_jmrt_2023_05_116
Cites_doi 10.1109/TDEI.2013.6633729
10.1108/03321641211209861
ContentType Journal Article
Copyright Published under licence by IOP Publishing Ltd
2018. This work is published under http://creativecommons.org/licenses/by/3.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.
Copyright_xml – notice: Published under licence by IOP Publishing Ltd
– notice: 2018. This work is published under http://creativecommons.org/licenses/by/3.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.
DBID O3W
TSCCA
AAYXX
CITATION
8FE
8FG
ABJCF
ABUWG
AFKRA
AZQEC
BENPR
BGLVJ
CCPQU
D1I
DWQXO
HCIFZ
KB.
L6V
M7S
PDBOC
PIMPY
PQEST
PQQKQ
PQUKI
PRINS
PTHSS
DOI 10.1088/1757-899X/292/1/012042
DatabaseName Open Access: IOP Publishing Free Content
IOPscience (Open Access)
CrossRef
ProQuest SciTech Collection
ProQuest Technology Collection
Materials Science & Engineering Collection
ProQuest Central (Alumni)
ProQuest Central UK/Ireland
ProQuest Central Essentials
ProQuest Central
Technology Collection
ProQuest One Community College
ProQuest Materials Science Collection
ProQuest Central
SciTech Premium Collection (Proquest) (PQ_SDU_P3)
Materials Science Database
ProQuest Engineering Collection
Engineering Database
Materials Science Collection
Publicly Available Content Database
ProQuest One Academic Eastern Edition (DO NOT USE)
ProQuest One Academic
ProQuest One Academic UKI Edition
ProQuest Central China
Engineering collection
DatabaseTitle CrossRef
Publicly Available Content Database
ProQuest Materials Science Collection
Engineering Database
Technology Collection
ProQuest Central Essentials
ProQuest One Academic Eastern Edition
Materials Science Collection
ProQuest Central (Alumni Edition)
SciTech Premium Collection
ProQuest One Community College
ProQuest Technology Collection
ProQuest SciTech Collection
ProQuest Central China
ProQuest Central
ProQuest Engineering Collection
ProQuest One Academic UKI Edition
ProQuest Central Korea
Materials Science & Engineering Collection
Materials Science Database
ProQuest One Academic
Engineering Collection
DatabaseTitleList
Publicly Available Content Database
Database_xml – sequence: 1
  dbid: O3W
  name: Open Access: IOP Publishing Free Content
  url: http://iopscience.iop.org/
  sourceTypes:
    Enrichment Source
    Publisher
– sequence: 2
  dbid: 8FG
  name: ProQuest Technology Collection
  url: https://search.proquest.com/technologycollection1
  sourceTypes: Aggregation Database
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
DocumentTitleAlternate Simulation of the temperature field distribution in medium-voltage vacuum interrupter and experimental verification
EISSN 1757-899X
ExternalDocumentID 10_1088_1757_899X_292_1_012042
MSE_292_1_012042
GroupedDBID 1JI
5B3
5PX
5VS
AAJIO
AAJKP
AALHV
ABHWH
ABJCF
ACAFW
ACGFO
ACHIP
ACIPV
AEFHF
AEJGL
AFKRA
AFYNE
AHSEE
AIYBF
AKPSB
ALMA_UNASSIGNED_HOLDINGS
ASPBG
ATQHT
AVWKF
AZFZN
BENPR
BGLVJ
CCPQU
CEBXE
CJUJL
CRLBU
EBS
EDWGO
EJD
EQZZN
GROUPED_DOAJ
GX1
HCIFZ
HH5
IJHAN
IOP
IZVLO
KB.
KNG
KQ8
M7S
N5L
O3W
OK1
P2P
PDBOC
PIMPY
PJBAE
PTHSS
RIN
RNS
SY9
T37
TR2
TSCCA
W28
02O
1WK
4.4
AAYXX
AERVB
BBWZM
CITATION
FEDTE
HVGLF
JCGBZ
M48
Q02
8FE
8FG
ABUWG
AZQEC
D1I
DWQXO
L6V
PQEST
PQQKQ
PQUKI
PRINS
ID FETCH-LOGICAL-c407t-fee05b7279942b6b8d34fded166b4f426b25401ec1037f32e69725fd4c91e6df3
IEDL.DBID BENPR
ISSN 1757-8981
IngestDate Thu Oct 10 20:06:48 EDT 2024
Thu Sep 26 16:43:49 EDT 2024
Wed Aug 21 03:33:10 EDT 2024
Thu Jan 07 13:49:12 EST 2021
IsDoiOpenAccess true
IsOpenAccess true
IsPeerReviewed true
IsScholarly true
Issue 1
Language English
License Content from this work may be used under the terms of the Creative Commons Attribution 3.0 licence. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI.
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c407t-fee05b7279942b6b8d34fded166b4f426b25401ec1037f32e69725fd4c91e6df3
OpenAccessLink https://www.proquest.com/docview/2556561554?pq-origsite=%requestingapplication%
PQID 2556561554
PQPubID 4998670
PageCount 10
ParticipantIDs iop_journals_10_1088_1757_899X_292_1_012042
crossref_primary_10_1088_1757_899X_292_1_012042
proquest_journals_2556561554
PublicationCentury 2000
PublicationDate 2018-01-01
PublicationDateYYYYMMDD 2018-01-01
PublicationDate_xml – month: 01
  year: 2018
  text: 2018-01-01
  day: 01
PublicationDecade 2010
PublicationPlace Bristol
PublicationPlace_xml – name: Bristol
PublicationTitle IOP conference series. Materials Science and Engineering
PublicationTitleAlternate IOP Conf. Ser.: Mater. Sci. Eng
PublicationYear 2018
Publisher IOP Publishing
Publisher_xml – name: IOP Publishing
References Liang S H (4) 2000; 3
Mateev V (2) 2014
Cadick J (3) 2012
Yu L (1) 2010
6
7
Chen D G (5) 2010
References_xml – volume: 3
  start-page: 66
  issn: 0254-587X
  year: 2000
  ident: 4
  publication-title: Transactions of Metal Heat Treatment
  contributor:
    fullname: Liang S H
– ident: 7
  doi: 10.1109/TDEI.2013.6633729
– year: 2010
  ident: 1
  publication-title: Research on development of large current vacuum circuit breaker and key issues
  contributor:
    fullname: Yu L
– year: 2012
  ident: 3
  publication-title: Predicting the remaining life of vacuum interrupters in the field
  contributor:
    fullname: Cadick J
– year: 2010
  ident: 5
  publication-title: Virtual prototype technology of low voltage circuit breaker
  contributor:
    fullname: Chen D G
– ident: 6
  doi: 10.1108/03321641211209861
– start-page: 133
  year: 2014
  ident: 2
  publication-title: Proceedings of XVIII-th International Symposium of Electrical Apparatusand Technologies SIELA
  contributor:
    fullname: Mateev V
SSID ssj0067440
Score 2.1181269
Snippet The temperature field distribution in the medium-voltage vacuum interrupter decides the thermal stability of it. In this paper, the simulation model of a kind...
SourceID proquest
crossref
iop
SourceType Aggregation Database
Enrichment Source
Publisher
StartPage 12042
SubjectTerms Electric contacts
Electric potential
Finite element method
Interrupters
Ohmic dissipation
Resistance heating
Simulation
Steady state
Temperature distribution
Thermal stability
Voltage
SummonAdditionalLinks – databaseName: Open Access: IOP Publishing Free Content
  dbid: O3W
  link: http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1LS8NAEF60XvQgPrFaZQVvEvPabLJHkZYiqIda7G3JvqCHpqFN_P3ObhJsEREvIZDZ7DK7mUdm5huE7igcnNzGBzMZac9qCC8HP8JjUiRUScNglM22eKXjKXmeJV02oauFWZat6H-A2wYouGFhmxCX-aDwQLAyNvMjFvmhb8s_CUjhPdC9zkZ6iz86YUwt_p2riXRjsrArEv71PVv6aRfW8ENIO80zOkKHrcmIH5sFHqMdXZyggw0gwVO0nswXbR8uvDQYjDpsMadawGTs0tSwshi5bXsrPC-wDavXCw_kUwVCBX_msq4X2OJHrFZ1CVecFwpvtgDAcO5tapGb6AxNR8P3p7HXtlPwJHhtlWe0DhIB9gpjJBJUZComRmkVUiqIAU0twFkMQi1t6aCJI01ZGiVGEclCTZWJz1GvWBb6AmHYRnCdkzhPiSaBTPPUMGPy0IbphA5YH_kdE3nZoGZwF-3OMm7Zzi3bObCdh7xhex_dA695-wGt_6S-3aJ-mQy3nvNSmT4adPv2TWgB1xIbiiWX_5rwCu2DpZQ1_14GqFetan0N1kglbtx5-wJ5LNSf
  priority: 102
  providerName: IOP Publishing
Title Simulation of the temperature field distribution in medium-voltage vacuum interrupter and experimental verification
URI https://iopscience.iop.org/article/10.1088/1757-899X/292/1/012042
https://www.proquest.com/docview/2556561554
Volume 292
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwhV1LS8NAEF6sXvQgPrE-ygreJKRJNtvsSVRaH-ADa7G3JdkH9NA0to2_35l0Qy2CXhaS3RCYnZ3Hzsw3hFxwYJwU44OJCo2HGsJLwY_whMpirpUV8BVmWzzz-wF7HMZDd-E2c2mVtUysBLWeKLwj9xEqK8YgGrsqPj3sGoXRVddCo0E2woBhmHbjpvv8-lbLYo7wd1VJZAyyWCRBXSMMbp97J4Z-KEI_8LGKlIUr6qkxmhS_ZHSleHo7ZNtZjPR6scW7ZM3ke2TrB47gPpn1R2PXhotOLAWbjiLklMNLplWWGtUIkeu6W9FRTjGqXo49EE9zkCn0K1VlOaYIHzGdlgWMNM01_dkBgALbY2ZR9aMDMuh132_vPddNwVPgtM09a0w7zsBcEYKFGc8SHTGrjQ44z5gFRZ2Br9gOjMLKQRuFhotOGFvNlAgM1zY6JOv5JDdHhMIuguccR2mHGdZWnbRjhbVpgFG6zLRFk_g1EWWxAM2QVbA7SSSSXSLZJZBdBnJB9ia5BFpLd35m_64-X1n91O-uzMtC2yY5rfdtuXDJRMd_T5-QTbCMksVdyylZn09LcwbWxzxrkUbSu2s5RoOnh5dXGF-ij2-4C9jA
link.rule.ids 315,786,790,12792,21416,27955,27956,33406,33777,38898,38923,43633,43838,53875,53901
linkProvider ProQuest
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwhV1LT8MwDI4YHIAD4inGM0jcUNW1S9PmhBDaGM8LTNotavOQdlhXtpXfj92mGhMSXHpoUkWyXT9i-zMh1xwEJ8X8YKJC46GF8FKIIzyhsohrZQV8hdUWb3wwZE-jaOQu3OaurLLRiZWi1lOFd-Q-QmVFmERjt8Wnh1OjMLvqRmi0yAaDA1HOk_5Do4k5gt9VDZERaGKRBE2HMAR97p0Y-aEI_cDHHlIWrhin1nha_NLQldnp75Id5y_Su5rBe2TN5Ptk-weK4AGZv48nbggXnVoKHh1FwCmHlkyrGjWqESDXzbai45xiTr2ceKCcFqBR6FeqynJCETxiNisLeNI01_Qn_j8Foce6ouqgQzLs9z7uB56bpeApCNkWnjWmE2XgrAjBwoxnie4yq40OOM-YBTOdQaTYCYzCvkHbDQ0XcRhZzZQIDNe2e0TW82lujgkFHkLcHHXTmBnWUXEaW2FtGmCOLjMd0SZ-Q0RZ1JAZskp1J4lEskskuwSyy0DWZG-TG6C1dH_P_N_dVyu7X997K-uy0LZNzhq-LTcuRejk7-VLsjn4eH2RL49vz6dkC3ykpL51OSPri1lpzsEPWWQXlbB9Axnj114
linkToPdf http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwpV1La9tAEB6SFEpy6CsJcZu2W-gtyLLk1Up7DK2N06SuwQ34tmhfEIJlY0s55Nd3RpKbuKWU0osQaFeP2dl5aGa-AfgokHFyig9mJnYBaYggRz8ikEYnwhovcRZlW4zF6Jp_mSWzHRj8rIVZLFvR38XTBii4IWGbEJeFqPBQsEo5C2MZh1FI5Z88DpfW78IT3L8pZfZdfJtsBLIgDLy6LrKel0WbQuE_3mtLR-3ie_wmqGvtM3zeZImsa9BCSjq57Val7pr7XyAd__vDXsCz1j5l582kl7Djildw8Ai18BDW05t52_SLLTxDC5IRwFWLzszqnDhmCZC37aXFbgpGMfxqHqAwLFGCsbvcVNWcEVjFalUt8cjywrLH_QYYbjLKY6ofdATXw8H3T6Og7d0QGHQRy8A710s0GkdS8lgLndk-99bZSAjNPZoFGj3TXuQM1Sn6fuyETOPEW25k5IT1_WPYKxaFOwGGPIN-etLPU-54z6R56qX3eUQxQe16sgPhZrXUsoHoUHVoPcsUkVQRSRWSVEWqIWkHznANVLtb138d_WFr9NfpYOu6wgXqwOmGQR4GErpbQnFf_vqfHvgenk4-D9XVxfjyDeyjhZY1_3xOYa9cVe4tWkGlflfz-A8eb_oM
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Simulation+of+the+temperature+field+distribution+in+medium-voltage+vacuum+interrupter+and+experimental+verification&rft.jtitle=IOP+conference+series.+Materials+Science+and+Engineering&rft.au=Sun%2C+W&rft.au=Liu%2C+H+L&rft.au=Cai%2C+Y+G&rft.au=Li%2C+Y+L&rft.date=2018-01-01&rft.pub=IOP+Publishing&rft.issn=1757-8981&rft.eissn=1757-899X&rft.volume=292&rft.issue=1&rft_id=info:doi/10.1088%2F1757-899X%2F292%2F1%2F012042
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1757-8981&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1757-8981&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1757-8981&client=summon