Simulation of the temperature field distribution in medium-voltage vacuum interrupter and experimental verification
The temperature field distribution in the medium-voltage vacuum interrupter decides the thermal stability of it. In this paper, the simulation model of a kind of 12kV/3150A/40kA medium-voltage vacuum interrupter is constructed, and conductive bridge model is used. This paper simulates current contra...
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Published in | IOP conference series. Materials Science and Engineering Vol. 292; no. 1; pp. 12042 - 12051 |
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Main Authors | , , , , , |
Format | Journal Article |
Language | English |
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Bristol
IOP Publishing
01.01.2018
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Abstract | The temperature field distribution in the medium-voltage vacuum interrupter decides the thermal stability of it. In this paper, the simulation model of a kind of 12kV/3150A/40kA medium-voltage vacuum interrupter is constructed, and conductive bridge model is used. This paper simulates current contraction and Joule heating between contacts, and solves relevant problems using the function of the thermal-electrical coupling in the finite element software ANSYS. Steady-state temperature rise of vacuum interrupter at rated current and transient temperature rise of vacuum interrupter at short-time withstand current are calculated. Influence of the contact situation on vacuum interrupter temperature rise is analyzed. Steady-state temperature rise experiments for the interrupter are carried out, and experiment results verify the accuracy of simulation results. The results are useful in the designing and optimizing of medium-voltage vacuum interrupter. |
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AbstractList | The temperature field distribution in the medium-voltage vacuum interrupter decides the thermal stability of it. In this paper, the simulation model of a kind of 12kV/3150A/40kA medium-voltage vacuum interrupter is constructed, and conductive bridge model is used. This paper simulates current contraction and Joule heating between contacts, and solves relevant problems using the function of the thermal-electrical coupling in the finite element software ANSYS. Steady-state temperature rise of vacuum interrupter at rated current and transient temperature rise of vacuum interrupter at short-time withstand current are calculated. Influence of the contact situation on vacuum interrupter temperature rise is analyzed. Steady-state temperature rise experiments for the interrupter are carried out, and experiment results verify the accuracy of simulation results. The results are useful in the designing and optimizing of medium-voltage vacuum interrupter. |
Author | Sun, W Liu, H L Cai, Y G Zhou, Y Li, Y L Zhou, H Y |
Author_xml | – sequence: 1 givenname: W surname: Sun fullname: Sun, W email: sunwei19850525@163.com organization: Electric Power Research Institute of State Grid Heilongjiang Electric Power Company Limited – sequence: 2 givenname: H L surname: Liu fullname: Liu, H L organization: State Grid Heilongjiang Electric Power Company Limited – sequence: 3 givenname: Y G surname: Cai fullname: Cai, Y G organization: State Grid Heilongjiang Electric Power Company Limited – sequence: 4 givenname: Y L surname: Li fullname: Li, Y L organization: State Grid Heilongjiang Electric Power Equipment and Materials Company , ) – sequence: 5 givenname: H Y surname: Zhou fullname: Zhou, H Y organization: Electric Power Research Institute of State Grid Heilongjiang Electric Power Company Limited – sequence: 6 givenname: Y surname: Zhou fullname: Zhou, Y organization: Electric Power Research Institute of State Grid Heilongjiang Electric Power Company Limited |
BookMark | eNqFkE1LAzEQhoNU0Fb_ggS8eFmbpEl29yhSP6DioQrewu5moin7ZTYp-u9NW6kIgpdkYJ55Z3jGaNR2LSB0RsklJVk2palIkyzPX6YsZ1M6JZQRzg7Q8b4x2tcZPULjYVgRIlPOyTEalrYJdeFt1-LOYP8G2EPTgyt8cICNhVpjbQfvbBm2lG1xA9qGJll3tS9eAa-LKoQmNjw4F_r44qLVGD5ijG2g9UWN17E0ttouOkGHpqgHOP3-J-j5Zv50fZcsHm_vr68WScVJ6hMDQESZsjTPOStlmekZNxo0lbLkhjNZMsEJhYqSWWpmDGSeMmE0r3IKUpvZBJ3vcnvXvQcYvFp1wbVxpWJCSCGpEDxSckdVrhsGB0b18erCfSpK1Eaw2rhTG48qClZU7QTHwYvdoO36n-SH5fwXpvrtJewP9J_8L97Jj1w |
CitedBy_id | crossref_primary_10_1016_j_jmrt_2023_05_116 |
Cites_doi | 10.1109/TDEI.2013.6633729 10.1108/03321641211209861 |
ContentType | Journal Article |
Copyright | Published under licence by IOP Publishing Ltd 2018. This work is published under http://creativecommons.org/licenses/by/3.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License. |
Copyright_xml | – notice: Published under licence by IOP Publishing Ltd – notice: 2018. This work is published under http://creativecommons.org/licenses/by/3.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License. |
DBID | O3W TSCCA AAYXX CITATION 8FE 8FG ABJCF ABUWG AFKRA AZQEC BENPR BGLVJ CCPQU D1I DWQXO HCIFZ KB. L6V M7S PDBOC PIMPY PQEST PQQKQ PQUKI PRINS PTHSS |
DOI | 10.1088/1757-899X/292/1/012042 |
DatabaseName | Open Access: IOP Publishing Free Content IOPscience (Open Access) CrossRef ProQuest SciTech Collection ProQuest Technology Collection Materials Science & Engineering Collection ProQuest Central (Alumni) ProQuest Central UK/Ireland ProQuest Central Essentials ProQuest Central Technology Collection ProQuest One Community College ProQuest Materials Science Collection ProQuest Central SciTech Premium Collection (Proquest) (PQ_SDU_P3) Materials Science Database ProQuest Engineering Collection Engineering Database Materials Science Collection Publicly Available Content Database ProQuest One Academic Eastern Edition (DO NOT USE) ProQuest One Academic ProQuest One Academic UKI Edition ProQuest Central China Engineering collection |
DatabaseTitle | CrossRef Publicly Available Content Database ProQuest Materials Science Collection Engineering Database Technology Collection ProQuest Central Essentials ProQuest One Academic Eastern Edition Materials Science Collection ProQuest Central (Alumni Edition) SciTech Premium Collection ProQuest One Community College ProQuest Technology Collection ProQuest SciTech Collection ProQuest Central China ProQuest Central ProQuest Engineering Collection ProQuest One Academic UKI Edition ProQuest Central Korea Materials Science & Engineering Collection Materials Science Database ProQuest One Academic Engineering Collection |
DatabaseTitleList | Publicly Available Content Database |
Database_xml | – sequence: 1 dbid: O3W name: Open Access: IOP Publishing Free Content url: http://iopscience.iop.org/ sourceTypes: Enrichment Source Publisher – sequence: 2 dbid: 8FG name: ProQuest Technology Collection url: https://search.proquest.com/technologycollection1 sourceTypes: Aggregation Database |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Engineering |
DocumentTitleAlternate | Simulation of the temperature field distribution in medium-voltage vacuum interrupter and experimental verification |
EISSN | 1757-899X |
ExternalDocumentID | 10_1088_1757_899X_292_1_012042 MSE_292_1_012042 |
GroupedDBID | 1JI 5B3 5PX 5VS AAJIO AAJKP AALHV ABHWH ABJCF ACAFW ACGFO ACHIP ACIPV AEFHF AEJGL AFKRA AFYNE AHSEE AIYBF AKPSB ALMA_UNASSIGNED_HOLDINGS ASPBG ATQHT AVWKF AZFZN BENPR BGLVJ CCPQU CEBXE CJUJL CRLBU EBS EDWGO EJD EQZZN GROUPED_DOAJ GX1 HCIFZ HH5 IJHAN IOP IZVLO KB. KNG KQ8 M7S N5L O3W OK1 P2P PDBOC PIMPY PJBAE PTHSS RIN RNS SY9 T37 TR2 TSCCA W28 02O 1WK 4.4 AAYXX AERVB BBWZM CITATION FEDTE HVGLF JCGBZ M48 Q02 8FE 8FG ABUWG AZQEC D1I DWQXO L6V PQEST PQQKQ PQUKI PRINS |
ID | FETCH-LOGICAL-c407t-fee05b7279942b6b8d34fded166b4f426b25401ec1037f32e69725fd4c91e6df3 |
IEDL.DBID | BENPR |
ISSN | 1757-8981 |
IngestDate | Thu Oct 10 20:06:48 EDT 2024 Thu Sep 26 16:43:49 EDT 2024 Wed Aug 21 03:33:10 EDT 2024 Thu Jan 07 13:49:12 EST 2021 |
IsDoiOpenAccess | true |
IsOpenAccess | true |
IsPeerReviewed | true |
IsScholarly | true |
Issue | 1 |
Language | English |
License | Content from this work may be used under the terms of the Creative Commons Attribution 3.0 licence. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI. |
LinkModel | DirectLink |
MergedId | FETCHMERGED-LOGICAL-c407t-fee05b7279942b6b8d34fded166b4f426b25401ec1037f32e69725fd4c91e6df3 |
OpenAccessLink | https://www.proquest.com/docview/2556561554?pq-origsite=%requestingapplication% |
PQID | 2556561554 |
PQPubID | 4998670 |
PageCount | 10 |
ParticipantIDs | iop_journals_10_1088_1757_899X_292_1_012042 crossref_primary_10_1088_1757_899X_292_1_012042 proquest_journals_2556561554 |
PublicationCentury | 2000 |
PublicationDate | 2018-01-01 |
PublicationDateYYYYMMDD | 2018-01-01 |
PublicationDate_xml | – month: 01 year: 2018 text: 2018-01-01 day: 01 |
PublicationDecade | 2010 |
PublicationPlace | Bristol |
PublicationPlace_xml | – name: Bristol |
PublicationTitle | IOP conference series. Materials Science and Engineering |
PublicationTitleAlternate | IOP Conf. Ser.: Mater. Sci. Eng |
PublicationYear | 2018 |
Publisher | IOP Publishing |
Publisher_xml | – name: IOP Publishing |
References | Liang S H (4) 2000; 3 Mateev V (2) 2014 Cadick J (3) 2012 Yu L (1) 2010 6 7 Chen D G (5) 2010 |
References_xml | – volume: 3 start-page: 66 issn: 0254-587X year: 2000 ident: 4 publication-title: Transactions of Metal Heat Treatment contributor: fullname: Liang S H – ident: 7 doi: 10.1109/TDEI.2013.6633729 – year: 2010 ident: 1 publication-title: Research on development of large current vacuum circuit breaker and key issues contributor: fullname: Yu L – year: 2012 ident: 3 publication-title: Predicting the remaining life of vacuum interrupters in the field contributor: fullname: Cadick J – year: 2010 ident: 5 publication-title: Virtual prototype technology of low voltage circuit breaker contributor: fullname: Chen D G – ident: 6 doi: 10.1108/03321641211209861 – start-page: 133 year: 2014 ident: 2 publication-title: Proceedings of XVIII-th International Symposium of Electrical Apparatusand Technologies SIELA contributor: fullname: Mateev V |
SSID | ssj0067440 |
Score | 2.1181269 |
Snippet | The temperature field distribution in the medium-voltage vacuum interrupter decides the thermal stability of it. In this paper, the simulation model of a kind... |
SourceID | proquest crossref iop |
SourceType | Aggregation Database Enrichment Source Publisher |
StartPage | 12042 |
SubjectTerms | Electric contacts Electric potential Finite element method Interrupters Ohmic dissipation Resistance heating Simulation Steady state Temperature distribution Thermal stability Voltage |
SummonAdditionalLinks | – databaseName: Open Access: IOP Publishing Free Content dbid: O3W link: http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1LS8NAEF60XvQgPrFaZQVvEvPabLJHkZYiqIda7G3JvqCHpqFN_P3ObhJsEREvIZDZ7DK7mUdm5huE7igcnNzGBzMZac9qCC8HP8JjUiRUScNglM22eKXjKXmeJV02oauFWZat6H-A2wYouGFhmxCX-aDwQLAyNvMjFvmhb8s_CUjhPdC9zkZ6iz86YUwt_p2riXRjsrArEv71PVv6aRfW8ENIO80zOkKHrcmIH5sFHqMdXZyggw0gwVO0nswXbR8uvDQYjDpsMadawGTs0tSwshi5bXsrPC-wDavXCw_kUwVCBX_msq4X2OJHrFZ1CVecFwpvtgDAcO5tapGb6AxNR8P3p7HXtlPwJHhtlWe0DhIB9gpjJBJUZComRmkVUiqIAU0twFkMQi1t6aCJI01ZGiVGEclCTZWJz1GvWBb6AmHYRnCdkzhPiSaBTPPUMGPy0IbphA5YH_kdE3nZoGZwF-3OMm7Zzi3bObCdh7xhex_dA695-wGt_6S-3aJ-mQy3nvNSmT4adPv2TWgB1xIbiiWX_5rwCu2DpZQ1_14GqFetan0N1kglbtx5-wJ5LNSf priority: 102 providerName: IOP Publishing |
Title | Simulation of the temperature field distribution in medium-voltage vacuum interrupter and experimental verification |
URI | https://iopscience.iop.org/article/10.1088/1757-899X/292/1/012042 https://www.proquest.com/docview/2556561554 |
Volume | 292 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwhV1LS8NAEF6sXvQgPrE-ygreJKRJNtvsSVRaH-ADa7G3JdkH9NA0to2_35l0Qy2CXhaS3RCYnZ3Hzsw3hFxwYJwU44OJCo2HGsJLwY_whMpirpUV8BVmWzzz-wF7HMZDd-E2c2mVtUysBLWeKLwj9xEqK8YgGrsqPj3sGoXRVddCo0E2woBhmHbjpvv8-lbLYo7wd1VJZAyyWCRBXSMMbp97J4Z-KEI_8LGKlIUr6qkxmhS_ZHSleHo7ZNtZjPR6scW7ZM3ke2TrB47gPpn1R2PXhotOLAWbjiLklMNLplWWGtUIkeu6W9FRTjGqXo49EE9zkCn0K1VlOaYIHzGdlgWMNM01_dkBgALbY2ZR9aMDMuh132_vPddNwVPgtM09a0w7zsBcEYKFGc8SHTGrjQ44z5gFRZ2Br9gOjMLKQRuFhotOGFvNlAgM1zY6JOv5JDdHhMIuguccR2mHGdZWnbRjhbVpgFG6zLRFk_g1EWWxAM2QVbA7SSSSXSLZJZBdBnJB9ia5BFpLd35m_64-X1n91O-uzMtC2yY5rfdtuXDJRMd_T5-QTbCMksVdyylZn09LcwbWxzxrkUbSu2s5RoOnh5dXGF-ij2-4C9jA |
link.rule.ids | 315,786,790,12792,21416,27955,27956,33406,33777,38898,38923,43633,43838,53875,53901 |
linkProvider | ProQuest |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwhV1LT8MwDI4YHIAD4inGM0jcUNW1S9PmhBDaGM8LTNotavOQdlhXtpXfj92mGhMSXHpoUkWyXT9i-zMh1xwEJ8X8YKJC46GF8FKIIzyhsohrZQV8hdUWb3wwZE-jaOQu3OaurLLRiZWi1lOFd-Q-QmVFmERjt8Wnh1OjMLvqRmi0yAaDA1HOk_5Do4k5gt9VDZERaGKRBE2HMAR97p0Y-aEI_cDHHlIWrhin1nha_NLQldnp75Id5y_Su5rBe2TN5Ptk-weK4AGZv48nbggXnVoKHh1FwCmHlkyrGjWqESDXzbai45xiTr2ceKCcFqBR6FeqynJCETxiNisLeNI01_Qn_j8Foce6ouqgQzLs9z7uB56bpeApCNkWnjWmE2XgrAjBwoxnie4yq40OOM-YBTOdQaTYCYzCvkHbDQ0XcRhZzZQIDNe2e0TW82lujgkFHkLcHHXTmBnWUXEaW2FtGmCOLjMd0SZ-Q0RZ1JAZskp1J4lEskskuwSyy0DWZG-TG6C1dH_P_N_dVyu7X997K-uy0LZNzhq-LTcuRejk7-VLsjn4eH2RL49vz6dkC3ykpL51OSPri1lpzsEPWWQXlbB9Axnj114 |
linkToPdf | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwpV1La9tAEB6SFEpy6CsJcZu2W-gtyLLk1Up7DK2N06SuwQ34tmhfEIJlY0s55Nd3RpKbuKWU0osQaFeP2dl5aGa-AfgokHFyig9mJnYBaYggRz8ikEYnwhovcRZlW4zF6Jp_mSWzHRj8rIVZLFvR38XTBii4IWGbEJeFqPBQsEo5C2MZh1FI5Z88DpfW78IT3L8pZfZdfJtsBLIgDLy6LrKel0WbQuE_3mtLR-3ie_wmqGvtM3zeZImsa9BCSjq57Val7pr7XyAd__vDXsCz1j5l582kl7Djildw8Ai18BDW05t52_SLLTxDC5IRwFWLzszqnDhmCZC37aXFbgpGMfxqHqAwLFGCsbvcVNWcEVjFalUt8cjywrLH_QYYbjLKY6ofdATXw8H3T6Og7d0QGHQRy8A710s0GkdS8lgLndk-99bZSAjNPZoFGj3TXuQM1Sn6fuyETOPEW25k5IT1_WPYKxaFOwGGPIN-etLPU-54z6R56qX3eUQxQe16sgPhZrXUsoHoUHVoPcsUkVQRSRWSVEWqIWkHznANVLtb138d_WFr9NfpYOu6wgXqwOmGQR4GErpbQnFf_vqfHvgenk4-D9XVxfjyDeyjhZY1_3xOYa9cVe4tWkGlflfz-A8eb_oM |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Simulation+of+the+temperature+field+distribution+in+medium-voltage+vacuum+interrupter+and+experimental+verification&rft.jtitle=IOP+conference+series.+Materials+Science+and+Engineering&rft.au=Sun%2C+W&rft.au=Liu%2C+H+L&rft.au=Cai%2C+Y+G&rft.au=Li%2C+Y+L&rft.date=2018-01-01&rft.pub=IOP+Publishing&rft.issn=1757-8981&rft.eissn=1757-899X&rft.volume=292&rft.issue=1&rft_id=info:doi/10.1088%2F1757-899X%2F292%2F1%2F012042 |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1757-8981&client=summon |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1757-8981&client=summon |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1757-8981&client=summon |