Time- and energy resolved photoemission electron microscopy-imaging of photoelectron time-of-flight analysis by means of pulsed excitations

• Published in: Journal of electron spectroscopy and related phenomena Vol. 178; pp. 317 - 330
• Main Authors: Oelsner, Andreas, Rohmer, Martin, Schneider, Christian, Bayer, Daniela, Schönhense, Gerd, Aeschlimann, Martin
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 01.05.2010
• Subjects: Delay line detector; Photoemission electron microscopy; Time-of-flight; Time-resolved photoemission; Delay line detector; Photoemission electron microscopy; Time-resolved photoemission; Time-of-flight

The present work enlightens the developments in time- and energy resolved photoemission electron microscopy over the past few years. We describe basic principles of the technique and demonstrate different applications. An energy- and time-filtering photoemission electron microscopy (PEEM) for real-t...