APA (7th ed.) Citation

Oelsner, A., Rohmer, M., Schneider, C., Bayer, D., Schönhense, G., & Aeschlimann, M. (2010). Time- and energy resolved photoemission electron microscopy-imaging of photoelectron time-of-flight analysis by means of pulsed excitations. Journal of electron spectroscopy and related phenomena, 178, 317-330. https://doi.org/10.1016/j.elspec.2009.10.008

Chicago Style (17th ed.) Citation

Oelsner, Andreas, Martin Rohmer, Christian Schneider, Daniela Bayer, Gerd Schönhense, and Martin Aeschlimann. "Time- and Energy Resolved Photoemission Electron Microscopy-imaging of Photoelectron Time-of-flight Analysis by Means of Pulsed Excitations." Journal of Electron Spectroscopy and Related Phenomena 178 (2010): 317-330. https://doi.org/10.1016/j.elspec.2009.10.008.

MLA (9th ed.) Citation

Oelsner, Andreas, et al. "Time- and Energy Resolved Photoemission Electron Microscopy-imaging of Photoelectron Time-of-flight Analysis by Means of Pulsed Excitations." Journal of Electron Spectroscopy and Related Phenomena, vol. 178, 2010, pp. 317-330, https://doi.org/10.1016/j.elspec.2009.10.008.