Design and test methodology for an analog-to-digital converter multichip module for experimental all-digital radar receiver operating at 2 gigasamples/s

• Published in: IEEE transactions on advanced packaging Vol. 22; no. 4; pp. 649 - 664
• Main Authors: Thompson, R.L., Amundsen, E.L.H., Schaefer, T.M., Riemer, P.J., Degerstrom, M.J., Gilbert, B.K.
• Format: Journal Article Conference Proceeding
• Language: English
• Published: Piscataway, NY IEEE 01.11.1999; Institute of Electrical and Electronics Engineers
• Subjects: Airborne radar; Analog to digital conversion; Analog-digital conversion; Applied sciences; Assembly; Chips; Circuit properties; Conversion; Converters; Data analysis; Design methodology; Electric, optical and optoelectronic circuits; Electronic circuits; Electronics; Evolution; Exact sciences and technology; Frequency; Laminates; Multichip modules; Packaging; Performance analysis; Signal convertors; Testing; AD converter; Circuit design; Multichip module; Fast Fourier transformation; Radar; Test method; Receiver
• ISSN: 1521-3323; 1557-9980
• DOI: 10.1109/6040.803458

In this paper, we describe the development of an analog-to-digital (A/D) converter subsystem, based on a monolithic A/D converter chip, a demultiplexer chip, and a laminate multichip module, for an experimental all-digital receiver for an airborne radar. The evolution of techniques for recording and analyzing all the data from the assembled multichip module at the full sample rate of the A/D converter, and the ways in which this test data can be used to analyze the performance of A/D converters, are described. The problems which arise in the testing of GHz A/D converters, a number of which are unique to A/D conversion at such high sample rates, are pointed out. Finally, comments on future directions in the test of high performance A/D converters are presented.