Polymeric structures at interfaces: An X-ray scattering study

X-ray scattering based on synchrotron radiation enables the detection of polymeric structures at interfaces despite the weak contrast between adjacent polymers build-up from different monomeric units. Variable types of polymeric structures result from typical pattern directing mechanisms, such as de...

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Published inZeitschrift für Kristallographie. Crystalline materials Vol. 219; no. 4; pp. 210 - 217
Main Authors Panagiotou, Panteleimon, Bauer, Estelle, Loi, Simona, Titz, Tobias, Maurer, Edith, Müller-Buschbaum, Peter
Format Journal Article
LanguageEnglish
Published De Gruyter Oldenbourg 01.04.2004
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Summary:X-ray scattering based on synchrotron radiation enables the detection of polymeric structures at interfaces despite the weak contrast between adjacent polymers build-up from different monomeric units. Variable types of polymeric structures result from typical pattern directing mechanisms, such as dewetting in case of homopolymer films, phase separation in polymer blend films, micro-phase separation in diblock copolymer films and surface enrichment in statistical copolymer films. The pattern directing mechanisms introduce structures ordered perpendicular and parallel to the polymeric surface. Consequently, specular and off-specular X-ray scattering is applied as demonstrated within examples. From scattering the characteristic structures which are not accessible by means of other techniques are determined. Limitations with respect to isolated objects such as holes are discussed.
ISSN:2194-4946
2196-7105
DOI:10.1524/zkri.219.4.210.30444