Fault Classification in Phase‐Locked Loops Using Back Propagation Neural Networks

• Published in: ETRI journal Vol. 30; no. 4; pp. 546 - 554
• Main Authors: Ramesh, Jayabalan, Vanathi, Ponnusamy Thangapandian, Gunavathi, Kandasamy
• Format: Journal Article
• Language: English
• Published: 한국전자통신연구원 01.08.2008
• Subjects: back propagation neural network; charge‐pump; Fault classification; phase frequency detector; PLL testing; 전자/정보통신공학

Phase‐locked loops (PLLs) are among the most important mixed‐signal building blocks of modern communication and control circuits, where they are used for frequency and phase synchronization, modulation, and demodulation as well as frequency synthesis. The growing popularity of PLLs has increased the...