Nonlinear detection of ultrasonic vibrations in an atomic force microscope

A new method is proposed to detect ultrasonic vibration of the samples in the Atomic Force Microscope (AFM) using nonlinearity in the tip-sample interaction force curve F ( z ). Small amplitude ultrasonic vibration less than 0.2 nm is detected as an average displacement of a cantilever. This Ultraso...

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Bibliographic Details
Published inJapanese Journal of Applied Physics Vol. 32; no. 8A; pp. L1095 - L1098
Main Authors KOLOSOV, O, YAMANAKA, K
Format Journal Article
LanguageEnglish
Published Tokyo Japanese journal of applied physics 01.08.1993
Subjects
Exact sciences and technology
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Other topics in instruments, apparatus, components and techniques common to several branches of physics and astronomy
Physics
Atomic force microscopy
Vibration
Viscoelastic material
Ultrasound
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Summary:A new method is proposed to detect ultrasonic vibration of the samples in the Atomic Force Microscope (AFM) using nonlinearity in the tip-sample interaction force curve F ( z ). Small amplitude ultrasonic vibration less than 0.2 nm is detected as an average displacement of a cantilever. This Ultrasonic Force Mode (UFM) of operation is advantageous in detecting ultrasonic vibration with frequencies up to the GHz range, using an AFM cantilever with a resonant frequency below 100 kHz. It was found that a strong repulsive force is acting after an ultrasonic amplitude threshold of the is crossed, with the amplitude of this threshold depending upon the average force applied to the tip.
ISSN:0021-4922
1347-4065
DOI:10.1143/jjap.32.l1095