AMS method for depth profiling of trace elements concentration in materials – Construction and applications

• Published in: Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms Vol. 361; pp. 250 - 256
• Main Authors: Stan-Sion, C., Enachescu, M.
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 15.10.2015
• Subjects: AMS; Carbon; Concentration depth profiling; Construction materials; Craters; Depth profiling; Detectors; Impact analysis; Trace elements; Tungsten; Concentration depth profiling; 3H; 2H; AMS

The need to investigate the behavior of solid state materials on the impact/retention/repulsion/contamination/impregnation with special trace elements or radioactive elements has driven us to develop a modified Accelerator Mass Spectrometry (AMS) analyzing method that is able to perform the measurem...