Effect of substrate constraint on the stability and evolution of ferroelectric domain structures in thin films

• Published in: Acta materialia Vol. 50; no. 2; pp. 395 - 411
• Main Authors: Li, Y.L., Hu, S.Y., Liu, Z.K., Chen, L.Q.
• Format: Journal Article
• Language: English
• Published: Oxford Elsevier Ltd 01.01.2002; Elsevier Science
• Subjects: Computer simulation; Condensed matter: electronic structure, electrical, magnetic, and optical properties; Dielectric thin films; Dielectrics, piezoelectrics, and ferroelectrics and their properties; Exact sciences and technology; Ferroelectric domain structure; Physics; Thin films; Thin films; Computer simulation; Ferroelectric domain structure; Stability; Domain structure; Ferroelectric domain; Theoretical study; Stress effects; Computerized simulation
• ISSN: 1359-6454; 1873-2453
• DOI: 10.1016/S1359-6454(01)00360-3

The stability and evolution of ferroelectric domain structures in thin films are studied. Elastic solutions are derived for both elastically anisotropic and isotropic thin films with arbitrary domain structures, subject to the mixed stress-free and constraint boundary conditions. These solutions are...