A self‐biased and all‐in‐one voltage and current reference
This Letter presents a high‐performance self‐biased and all‐in‐one voltage and current reference without BJT and V–I converter exploiting the zero‐temperature‐coefficient point of the N‐type MOSFET. With the help of the low‐temperature‐coefficient resistors and the self‐biased two‐stage OTA structur...
Saved in:
| Published in | Electronics letters Vol. 57; no. 1; pp. 6 - 8 |
|---|---|
| Main Authors | , , , , |
| Format | Journal Article |
| Language | English |
| Published |
Stevenage
John Wiley & Sons, Inc
01.01.2021
Wiley |
| Subjects | |
| Online Access | Get full text |
Cover
Loading…
| Abstract | This Letter presents a high‐performance self‐biased and all‐in‐one voltage and current reference without BJT and V–I converter exploiting the zero‐temperature‐coefficient point of the N‐type MOSFET. With the help of the low‐temperature‐coefficient resistors and the self‐biased two‐stage OTA structure, the all‐in‐one reference can achieve the average temperature coefficients of 6.6 and 34 ppm/°C of voltage and current reference from −40 to 125 °C, respectively. Meanwhile, the line sensitivities are 0.08%/V and 0.23%/V of voltage and current reference. And the power supply rejection ratio of the voltage reference is −93 dB@100 Hz with the power consumption of 12.6 μW@tt corner and VDD = 2.5 V. The reference circuit is realized in a standard 180 nm CMOS process with the area of 0.0621 mm × mm. |
|---|---|
| AbstractList | This Letter presents a high‐performance self‐biased and all‐in‐one voltage and current reference without BJT and V–I converter exploiting the zero‐temperature‐coefficient point of the N‐type MOSFET. With the help of the low‐temperature‐coefficient resistors and the self‐biased two‐stage OTA structure, the all‐in‐one reference can achieve the average temperature coefficients of 6.6 and 34 ppm/°C of voltage and current reference from −40 to 125 °C, respectively. Meanwhile, the line sensitivities are 0.08%/V and 0.23%/V of voltage and current reference. And the power supply rejection ratio of the voltage reference is −93 dB@100 Hz with the power consumption of 12.6 μW@tt corner and VDD = 2.5 V. The reference circuit is realized in a standard 180 nm CMOS process with the area of 0.0621 mm × mm. This Letter presents a high‐performance self‐biased and all‐in‐one voltage and current reference without BJT and V–I converter exploiting the zero‐temperature‐coefficient point of the N‐type MOSFET. With the help of the low‐temperature‐coefficient resistors and the self‐biased two‐stage OTA structure, the all‐in‐one reference can achieve the average temperature coefficients of 6.6 and 34 ppm/°C of voltage and current reference from −40 to 125 °C, respectively. Meanwhile, the line sensitivities are 0.08%/V and 0.23%/V of voltage and current reference. And the power supply rejection ratio of the voltage reference is −93 dB@100 Hz with the power consumption of 12.6 μW@tt corner and VDD = 2.5 V. The reference circuit is realized in a standard 180 nm CMOS process with the area of 0.0621 mm × mm. Abstract This Letter presents a high‐performance self‐biased and all‐in‐one voltage and current reference without BJT and V–I converter exploiting the zero‐temperature‐coefficient point of the N‐type MOSFET. With the help of the low‐temperature‐coefficient resistors and the self‐biased two‐stage OTA structure, the all‐in‐one reference can achieve the average temperature coefficients of 6.6 and 34 ppm/°C of voltage and current reference from −40 to 125 °C, respectively. Meanwhile, the line sensitivities are 0.08%/V and 0.23%/V of voltage and current reference. And the power supply rejection ratio of the voltage reference is −93 dB@100 Hz with the power consumption of 12.6 μW@tt corner and VDD = 2.5 V. The reference circuit is realized in a standard 180 nm CMOS process with the area of 0.0621 mm × mm. |
| Author | Luo, Ping Yang, Bingzhong Tang, Tianyuan Wang, Yuanfei Zhang, Bo |
| Author_xml | – sequence: 1 givenname: Yuanfei orcidid: 0000-0003-2247-0997 surname: Wang fullname: Wang, Yuanfei organization: University of Electronic Science and Technology of China – sequence: 2 givenname: Ping surname: Luo fullname: Luo, Ping email: pingl@uestc.edu.cn organization: University of Electronic Science and Technology of China – sequence: 3 givenname: Bingzhong surname: Yang fullname: Yang, Bingzhong organization: University of Electronic Science and Technology of China – sequence: 4 givenname: Tianyuan surname: Tang fullname: Tang, Tianyuan organization: University of Electronic Science and Technology of China – sequence: 5 givenname: Bo surname: Zhang fullname: Zhang, Bo organization: University of Electronic Science and Technology of China |
| BookMark | eNp9kM9KAzEQxoNUsK1efIIFb8LW_Nvu5maRqoUFLwreQjaZlC1xU5NW6c1H8Bl9EtOuiCcPSYaZ33yZ-UZo0PkOEDoneEIwF1fgHJ0Qill5hIaEFTgXhDwP_sQnaBTjCmNChSiH6HqWRXD26-OzaVUEk6kuHedSou3SleSzN-82agmHkt6GAN0mC2AhBRpO0bFVLsLZzztGT7fzx5v7vH64W9zM6lzzNE3OlFZ8ykjTYCDEEENVIQpRgamsqYxiqsDWVqXgpZ5qwy03Rghd8YpaWoqCjdGi1zVereQ6tC8q7KRXrTwkfFhKFTatdiC5EtOmKAgzWHGgVWOg0QURVhBeWi6S1kWvtQ7-dQtxI1d-G7o0vmRY0ApzTnmiLntKBx9jWvj3V4Ll3m25d1se3E4w6eH31sHuH1LO65r2Pd9yz4Sr |
| CitedBy_id | crossref_primary_10_1016_j_mejo_2024_106277 |
| Cites_doi | 10.1109/VLSI-DAT.2019.8741737 10.1109/81.933328 10.1109/ASICON.2017.8252532 10.1109/JSSC.2016.2627544 10.1109/ISSCC.2017.7870280 |
| ContentType | Journal Article |
| Copyright | 2020 The Authors. published by John Wiley & Sons Ltd on behalf of The Institution of Engineering and Technology 2021. This work is published under http://creativecommons.org/licenses/by/4.0/ (the "License"). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License. |
| Copyright_xml | – notice: 2020 The Authors. published by John Wiley & Sons Ltd on behalf of The Institution of Engineering and Technology – notice: 2021. This work is published under http://creativecommons.org/licenses/by/4.0/ (the "License"). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License. |
| DBID | 24P WIN AAYXX CITATION 8FE 8FG ABJCF AFKRA ARAPS AZQEC BENPR BGLVJ CCPQU DWQXO GNUQQ HCIFZ JQ2 K7- L6V M7S P5Z P62 PQEST PQQKQ PQUKI PTHSS DOA |
| DOI | 10.1049/ell2.12037 |
| DatabaseName | Wiley Online Library Open Access Wiley Online Library Free Content CrossRef ProQuest SciTech Collection ProQuest Technology Collection Materials Science & Engineering Collection ProQuest Central Advanced Technologies & Aerospace Database (1962 - current) ProQuest Central Essentials ProQuest Central Technology Collection ProQuest One Community College ProQuest Central Korea ProQuest Central Student SciTech Premium Collection ProQuest Computer Science Collection Computer Science Database ProQuest Engineering Collection Engineering Database Advanced Technologies & Aerospace Database ProQuest Advanced Technologies & Aerospace Collection ProQuest One Academic Eastern Edition (DO NOT USE) ProQuest One Academic ProQuest One Academic UKI Edition Engineering Collection DOAJ Directory of Open Access Journals |
| DatabaseTitle | CrossRef Advanced Technologies & Aerospace Collection Engineering Database Computer Science Database ProQuest Central Student Technology Collection ProQuest Advanced Technologies & Aerospace Collection ProQuest Central Essentials ProQuest Computer Science Collection ProQuest One Academic Eastern Edition SciTech Premium Collection ProQuest One Community College ProQuest Technology Collection ProQuest SciTech Collection ProQuest Central Advanced Technologies & Aerospace Database ProQuest Engineering Collection ProQuest One Academic UKI Edition ProQuest Central Korea Materials Science & Engineering Collection ProQuest One Academic Engineering Collection |
| DatabaseTitleList | Advanced Technologies & Aerospace Collection |
| Database_xml | – sequence: 1 dbid: DOA name: DOAJ Directory of Open Access Journals url: https://www.doaj.org/ sourceTypes: Open Website – sequence: 2 dbid: 24P name: Wiley Online Library Open Access url: https://authorservices.wiley.com/open-science/open-access/browse-journals.html sourceTypes: Publisher – sequence: 3 dbid: 8FG name: ProQuest Technology Collection url: https://search.proquest.com/technologycollection1 sourceTypes: Aggregation Database |
| DeliveryMethod | fulltext_linktorsrc |
| Discipline | Engineering |
| EISSN | 1350-911X |
| EndPage | 8 |
| ExternalDocumentID | oai_doaj_org_article_4a96b5513d0a4e28bdebc519f9147f49 10_1049_ell2_12037 ELL212037 |
| Genre | letter |
| GeographicLocations | China |
| GeographicLocations_xml | – name: China |
| GrantInformation_xml | – fundername: YY funderid: 31513030204; 31513030209 – fundername: Nation Natural Science Foundation of China and the China Academy of Engineering Physics (NSFA) funderid: U163117 |
| GroupedDBID | -4A -~X .DC 0R~ 0ZK 1OC 24P 29G 2QL 3EH 4.4 4IJ 5GY 6IK 8FE 8FG 8VB 96U AAHHS AAHJG AAJGR ABJCF ABQXS ACCFJ ACESK ACGFO ACGFS ACIWK ACXQS ADEYR ADIYS ADZOD AEEZP AEGXH AENEX AEQDE AFAZI AFKRA AI. AIAGR AIWBW AJBDE ALMA_UNASSIGNED_HOLDINGS ALUQN ARAPS AVUZU BBWZM BENPR BGLVJ CCPQU CS3 DU5 EBS EJD ELQJU ESX F20 F5P F8P GOZPB GROUPED_DOAJ GRPMH HCIFZ HZ~ IAO IFBGX IFIPE IPLJI JAVBF K1G K7- L6V LAI LXO LXU M43 M7S MCNEO MS~ NADUK NXXTH O9- OCL OK1 P0- P2P P62 PTHSS QWB R4Z RIE RIG RNS RUI TN5 U5U UNMZH VH1 WH7 WIN ZL0 ~ZZ AAYXX CITATION ITC AZQEC DWQXO GNUQQ JQ2 PQEST PQQKQ PQUKI |
| ID | FETCH-LOGICAL-c4037-3aca4631bb0e11d1d2a59598ed8fd8da3a50ff87947c6cd4f4dd99c8482f27953 |
| IEDL.DBID | 24P |
| ISSN | 1350-911X 0013-5194 |
| IngestDate | Thu Sep 05 15:46:24 EDT 2024 Fri Sep 13 09:40:01 EDT 2024 Thu Sep 26 19:33:31 EDT 2024 Sat Aug 24 01:04:34 EDT 2024 |
| IsDoiOpenAccess | true |
| IsOpenAccess | true |
| IsPeerReviewed | true |
| IsScholarly | true |
| Issue | 1 |
| Language | English |
| License | Attribution |
| LinkModel | DirectLink |
| MergedId | FETCHMERGED-LOGICAL-c4037-3aca4631bb0e11d1d2a59598ed8fd8da3a50ff87947c6cd4f4dd99c8482f27953 |
| ORCID | 0000-0003-2247-0997 |
| OpenAccessLink | https://onlinelibrary.wiley.com/doi/abs/10.1049%2Fell2.12037 |
| PQID | 3092804424 |
| PQPubID | 1936364 |
| PageCount | 3 |
| ParticipantIDs | doaj_primary_oai_doaj_org_article_4a96b5513d0a4e28bdebc519f9147f49 proquest_journals_3092804424 crossref_primary_10_1049_ell2_12037 wiley_primary_10_1049_ell2_12037_ELL212037 |
| PublicationCentury | 2000 |
| PublicationDate | January 2021 2021-01-00 20210101 2021-01-01 |
| PublicationDateYYYYMMDD | 2021-01-01 |
| PublicationDate_xml | – month: 01 year: 2021 text: January 2021 |
| PublicationDecade | 2020 |
| PublicationPlace | Stevenage |
| PublicationPlace_xml | – name: Stevenage |
| PublicationTitle | Electronics letters |
| PublicationYear | 2021 |
| Publisher | John Wiley & Sons, Inc Wiley |
| Publisher_xml | – name: John Wiley & Sons, Inc – name: Wiley |
| References | e_1_2_6_3_1 e_1_2_6_2_1 e_1_2_6_5_1 e_1_2_6_4_1 e_1_2_6_6_1 |
| References_xml | – ident: e_1_2_6_3_1 doi: 10.1109/VLSI-DAT.2019.8741737 – ident: e_1_2_6_6_1 doi: 10.1109/81.933328 – ident: e_1_2_6_2_1 doi: 10.1109/ASICON.2017.8252532 – ident: e_1_2_6_5_1 doi: 10.1109/JSSC.2016.2627544 – ident: e_1_2_6_4_1 doi: 10.1109/ISSCC.2017.7870280 |
| SSID | ssj0012997 |
| Score | 2.3775885 |
| Snippet | This Letter presents a high‐performance self‐biased and all‐in‐one voltage and current reference without BJT and V–I converter exploiting the... Abstract This Letter presents a high‐performance self‐biased and all‐in‐one voltage and current reference without BJT and V–I converter exploiting the... |
| SourceID | doaj proquest crossref wiley |
| SourceType | Open Website Aggregation Database Publisher |
| StartPage | 6 |
| SubjectTerms | Circuits CMOS integrated circuits Design Electric potential Power electronics, supply and supervisory circuits Power supply Temperature effects Voltage |
| SummonAdditionalLinks | – databaseName: DOAJ Directory of Open Access Journals dbid: DOA link: http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwrV3NSsQwEA7iSQ_iL1ZXKehJqNskkza5uYoiIp4UvIX8wkKpouvdR_AZfRKTtJV60YuHlpIOdJhpMl-SyTcIHbsYZDWjBcFWFUA8K3Rd6YKWzoQ5s6Hap2yLu-r6AW4e2eOo1FfMCevogTvDTUGJSscqJLZU4AjX1mkTYIcXGGoP3dE9zIbJVL9_EAbZeqhdEIRhICYFMXVNQ04xKWPl81EoSoz9P2DmGKymaHO1jtZ6mJjPOvU20JJrN9HqiDxwC53N8lfX-M_3Dz0Pocjmqg1X04SGeRtuT63Lw9izCANGemU6Jqb8u7DINnq4ury_uC76egiFgXiajyqjoKJY69JhbLEligkmuLPcW24VVaz0noceVpvKWPBgrRCGAyee1ILRHbTcho_vopwHYGiIsqCDFAWtKVNeqzqS6-PS6wwdDaaRzx3thUzb1SBkNKBMBszQebTat0Skqk4NwYGyd6D8y4EZmgw2l33_eZW0FISXAAQydJL88Isa8vL2lqSnvf9QaB-tkJi4ktZZJmh58fLmDgLyWOjD9JN9Afdh1S4 priority: 102 providerName: Directory of Open Access Journals – databaseName: ProQuest Technology Collection dbid: 8FG link: http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1Lb9QwEB6VcikHBG0RS1sUqZyQ0o3tSWKfSou6rFDFiUq9WR4_UKUo28dy5yfwG_tLsL3Jdrn0kChyrCSayTzssb8P4JNPQZZqUXLmTIk81CW1DZWi8jaOma2gkFdb_GjmV_j9ur7egvm4FyYtqxx9YnbUbmHTHPlUVIrLCpHj1FCaBbDL6entXZn4o1KddSDTeAEvWcLES3vGZ9_W9YTodNuRyyDmLDgClaKa-q7jJ4xXiQl9IzRlBP__0s7N5DVHn9kbeD2kjcXZSs9vYcv3u_BqA0xwD76cFQ--C49__tJNDE2uMH08ui423PTxtOh9EX3RMjqQfMuukJmKNdHIPlzNLn5-nZcDP0JpMe3uE8YabAQjqjxjjjlualUr6Z0MTjojTF2FIKPFtbaxDgM6p5SVKHmIMqrFO9ju48vfQyFjomi5cUixl0AiUZtApk1g-6wKNIHjUTT6dgWDoXP5GpVOAtRZgBM4T1Jb90jQ1blhcf9LD5ag0aiGEq2Mqwx6Lsl5slEnQTFsA6oJHI4y14M9Pegn7U_gc9bDM5-hLy4veb768PyzDmCHpyUqeUblELaX97_9UcwxlvQx_z7_AJgG0Dk priority: 102 providerName: ProQuest |
| Title | A self‐biased and all‐in‐one voltage and current reference |
| URI | https://onlinelibrary.wiley.com/doi/abs/10.1049%2Fell2.12037 https://www.proquest.com/docview/3092804424/abstract/ https://doaj.org/article/4a96b5513d0a4e28bdebc519f9147f49 |
| Volume | 57 |
| hasFullText | 1 |
| inHoldings | 1 |
| isFullTextHit | |
| isPrint | |
| link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1La9wwEB7S5NIeSp90m2QxtKeCW1ka2RL00KTsNpQQQmlgb0KjRwkYpyTbe35CfmN-SSV5d5NcCj1YGFnGZkYz8-n1DcD7kIMsSVHzxtsaeZQ1dS3VggWXxsxOUCy7LU7aozP8vpCLLfi8Pgsz8kNsJtyyZRR_nQ3c0piFJIHarMS-5x8bzkT3CHYSrlG5T3M83awhJEdbUqsIybJJL9bkpKg_3b37IBwV1v4HUPM-YC0RZ_4Mnq6gYnUw6vY5bIXhBTy5RyD4Er4cVFehj7fXN3SewpGv7JCuvk8V50MqLoZQJf-zTE6jPHIjG1O1SS7yCs7ms59fj-pVToTaYT7RJ6yz2IqGiIWm8Y3nVmqpVfAqeuWtsJLFqJKVda51HiN6r7VTqHjknZbiNWwP6eNvoFIJHDpuPVJqJZBISBvJdplgv2GRJvBuLRrze6S-MGXJGrXJAjRFgBM4zFLbtMh01aXi4vKXWfV-g1a3lFPJeGYxcEU-kEvYMeoGu4h6AntrmZuVDV0ZwTRXDJHjBD4UPfzjN8zs-JiXu7f_03gXHvO8SaXMqezB9vLyT9hPKGNJ09KZUqnm36awczg7Of0xLSP2v_e-0NE |
| link.rule.ids | 315,786,790,870,2115,11589,12792,21416,27957,27958,33408,33779,43635,43840,46087,46511,74392,74659 |
| linkProvider | Wiley-Blackwell |
| linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3NTtwwEB7BcoAeELSgLj8lUnuqFEjsSWKfylKxLO2WE0jcLP8ipCgL7HLnEfqMfZLa3mRZLhwSRY6VRDP2zGQ8_j6AbzY4WVXQlORGpkhckaqqVCnNrPb_zJoqF6strsrRDf66LW7bhNu0LavsbGI01GaiQ478hGacsAyR4I-HxzSwRoXV1ZZCYxXWkHrXGXaKDy8Wqwje1FYdg4GPVLCDJ0V-YuuaHOckC_znSw4p4va_CTaXQ9boc4ZbsNkGi8lgrt1tWLHNR_iwBCH4CU4HydTW7t_LX3XvHZJJZOOPuvYN940_TRqbeAs082Yj3tJzPKZkQS-yAzfD8-ufo7RlRUg1hj19VGqJJc2Vymyem9wQWfCCM2uYM8xIKovMOebnWaVLbdChMZxrhow4UvGC7kKv8S__DAnz4aEm0qDyvSgqRQvplKwCxH6eOdWHr51oxMMc_ELERWvkIghQRAH24SxIbdEjAFbHhsnTnWjHv0DJSxXIZEwm0RKmjFXa68TxHCuHvA8HncxFO4um4lXnffge9fDOZ4jz8ZjEq733n3UE66PrP2Mxvrz6vQ8bJBSpxJzKAfRmT8_20EcZM_UlDqX_SrnPZw |
| linkToPdf | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3NbtQwEB5BKyE4IH7FlgKR4IQUNrHHiX2CtuyqwGpVISr1ZvkXVYqypbu99xH6jDwJttfZLpceEkWOlUQz45mxPfk-gA8uBlnNaElqq0oknpW6bXRJK2fCnNlQ7VO1xbw5PsXvZ-ws1z8tc1nl4BOTo7YLE9fIx7QShFeIBMc-l0WcfJ1-vvhTRgapuNOa6TTuw26LDQsWvns4mZ_83OwpBMfbDnwGIW_BAawUxdh1HflUkyqyoW-Fp4Ti_1_quZ3Apgg0fQKPc-pYHKx1_RTuuf4ZPNoCFHwOXw6Kpev83-sbfR7Cky1UH46uCw3nfTgtelcEf7QKTiTdMmt0pmJDNvICTqeTX0fHZeZIKA3GP_yoMgobWmtdubq2tSWKCSa4s9xbbhVVrPKeh1HXmsZY9GitEIYjJ560gtGXsNOHl7-Cgodk0RBlUYdeFLWmTHmt2gi4X1dej-D9IBp5sYbCkGkLG4WMApRJgCM4jFLb9Ijw1alhcflb5tEgUYlGR2oZWyl0hGvrtAk68aLG1qMYwf4gc5nH1FLeWsAIPiY93PEZcjKbkXS1d_ez3sGDYEdy9m3-4zU8JLFiJS2w7MPO6vLKvQkpx0q_zbb0D5Au1Qo |
| openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=A+self%E2%80%90biased+and+all%E2%80%90in%E2%80%90one+voltage+and+current+reference&rft.jtitle=Electronics+letters&rft.au=Wang%2C+Yuanfei&rft.au=Luo%2C+Ping&rft.au=Yang%2C+Bingzhong&rft.au=Tang%2C+Tianyuan&rft.date=2021-01-01&rft.issn=1350-911X&rft.eissn=1350-911X&rft.volume=57&rft.issue=1&rft.spage=6&rft.epage=8&rft_id=info:doi/10.1049%2Fell2.12037&rft.externalDBID=10.1049%252Fell2.12037&rft.externalDocID=ELL212037 |
| thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1350-911X&client=summon |
| thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1350-911X&client=summon |
| thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1350-911X&client=summon |