Influence of parallel magnetic field on cyclotron mass in double-layer two-dimensional electron system

The cyclotron resonance of the double-layer two-dimensional electron system in tilted magnetic fields is investigated with the far-infrared Fourier spectrometer. We measure the parallel magnetic field ( B |) dependence of cyclotron mass due to the distortion of the “Fermi loop” by B |.

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Bibliographic Details
Published inMicroelectronic engineering Vol. 47; no. 1; pp. 293 - 295
Main Authors Takaoka, S., Kuriyama, A., Oto, K., Murase, K., Cukr, M., Jungwirth, T., Smrcka, L.
Format Journal Article Conference Proceeding
LanguageEnglish
Published Amsterdam Elsevier B.V 01.06.1999
Elsevier Science
Subjects
Applied sciences
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Electronics
Exact sciences and technology
Iii-v and ii-vi semiconductors
Infrared and raman spectra and scattering
Microelectronic fabrication (materials and surfaces technology)
Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation
Physics
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Ternary compound
Cyclotron mass
Binary compound
Cyclotron resonance
Bilayer
Fourier spectrometry
III-V compound
Gallium Arsenides
Aluminium Arsenides
Parallel field
Microelectronic fabrication
Landau level
Far infrared spectrometry
Magnetic field
Heterojunction
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Summary:The cyclotron resonance of the double-layer two-dimensional electron system in tilted magnetic fields is investigated with the far-infrared Fourier spectrometer. We measure the parallel magnetic field ( B |) dependence of cyclotron mass due to the distortion of the “Fermi loop” by B |.
ISSN:0167-9317
1873-5568
DOI:10.1016/S0167-9317(99)00217-8