Influence of parallel magnetic field on cyclotron mass in double-layer two-dimensional electron system - Takaoka, S.; Kuriyama, A.; Oto, K.; Murase, K.; Cukr, M.; Jungwirth, T.; Smrcka, L. (Microelectronic engineering, 1999)
Keywords: Applied sciences; Condensed matter: electronic structure, electrical, magnetic, and optical properties; Electronics; Exact sciences and technology; Iii-v and ii-vi semiconductors; Infrared and raman spectra and scattering; Microelectronic fabrication (materials and surfaces technology); Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation; Physics; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices; Ternary compound; Cyclotron mass; Binary compound; Cyclotron resonance; Bilayer; Fourier spectrometry; III-V compound; Gallium Arsenides; Aluminium Arsenides; Parallel field; Microelectronic fabrication; Landau level; Far infrared spectrometry; Magnetic field; Heterojunction