Direct imaging of native passive film on stainless steel by aberration corrected STEM

A cross-section of a native passive film on a commercial type 304 stainless steel was directly imaged and characterized using an aberration corrected STEM-EDS in combination with FIB sectioning. The technique demonstrated an enrichment of Cr in the lower part of the passive film, and a depletion of...

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Published inCorrosion science Vol. 52; no. 12; pp. 3851 - 3854
Main Authors Hamada, Etsuo, Yamada, Katsumi, Nagoshi, Masayasu, Makiishi, Noriko, Sato, Kaoru, Ishii, Tomohiro, Fukuda, Kunio, Ishikawa, Shin, Ujiro, Takumi
Format Journal Article
LanguageEnglish
Published Kidlington Elsevier Ltd 01.12.2010
Elsevier
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Abstract A cross-section of a native passive film on a commercial type 304 stainless steel was directly imaged and characterized using an aberration corrected STEM-EDS in combination with FIB sectioning. The technique demonstrated an enrichment of Cr in the lower part of the passive film, and a depletion of Cr and an enrichment of Ni in the matrix side closest to the passive film/matrix interface in accordance with previous studies, further proving the advantage of this technique with respect to spatial resolution. That is, the STEM-EDS showed a compositional profile with higher spatial resolution compared to AES which has been mainly used for this type of investigation. The technique will be applicable to the investigation of nm to sub-nm compositional fluctuation of passive films, steel surfaces adjacent to inclusions and grain boundaries postulated as an initiating site of pitting corrosion or stress corrosion cracking (SCC).
AbstractList A cross-section of a native passive film on a commercial type 304 stainless steel was directly imaged and characterized using an aberration corrected STEM-EDS in combination with FIB sectioning. The technique demonstrated an enrichment of Cr in the lower part of the passive film, and a depletion of Cr and an enrichment of Ni in the matrix side closest to the passive film/matrix interface in accordance with previous studies, further proving the advantage of this technique with respect to spatial resolution. That is, the STEM-EDS showed a compositional profile with higher spatial resolution compared to AES which has been mainly used for this type of investigation. The technique will be applicable to the investigation of nm to sub-nm compositional fluctuation of passive films, steel surfaces adjacent to inclusions and grain boundaries postulated as an initiating site of pitting corrosion or stress corrosion cracking (SCC).
Author Yamada, Katsumi
Ujiro, Takumi
Ishikawa, Shin
Sato, Kaoru
Ishii, Tomohiro
Makiishi, Noriko
Nagoshi, Masayasu
Hamada, Etsuo
Fukuda, Kunio
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  givenname: Katsumi
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  givenname: Masayasu
  surname: Nagoshi
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  organization: Steel Research Laboratory, JFE Steel Corp., 1-1 Minamiwatarida-cho, Kawasaki-ku, Kawasaki 210-0855, Japan
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  givenname: Noriko
  surname: Makiishi
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  givenname: Tomohiro
  surname: Ishii
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  givenname: Kunio
  surname: Fukuda
  fullname: Fukuda, Kunio
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  givenname: Shin
  surname: Ishikawa
  fullname: Ishikawa, Shin
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– sequence: 9
  givenname: Takumi
  surname: Ujiro
  fullname: Ujiro, Takumi
  organization: Steel Research Laboratory, JFE Steel Corp., 1 Kawasaki-cho, Chuo-ku, Chiba 260-0835, Japan
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Issue 12
Keywords B. STEM
A. Stainless steel
C. Passive films
Corrosion
Stainless steel
Imaging
Surface layer
Passivity
Passivation
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Snippet A cross-section of a native passive film on a commercial type 304 stainless steel was directly imaged and characterized using an aberration corrected STEM-EDS...
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StartPage 3851
SubjectTerms A. Stainless steel
Applied sciences
B. STEM
C. Passive films
Corrosion
Corrosion environments
Exact sciences and technology
Metals. Metallurgy
Title Direct imaging of native passive film on stainless steel by aberration corrected STEM
URI https://dx.doi.org/10.1016/j.corsci.2010.08.025
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