Investigation of morphological and optical properties of nanostructured layers formed by the SSCT etching of silicon - Jurečka, Stanislav; Imamura, Kentaro; Matsumoto, Taketoshi; Kobayashi, Hikaru (Applied Surface Science, 2018)
Keywords: Effective media approximation; Morphology; Multifractal analysis; Nanostructure; Power spectral density; Raman scattering; Silicon; SSCT layer; Raman scattering; SSCT layer; Morphology; Power spectral density; Silicon; Nanostructure; Effective media approximation; Multifractal analysis