A step-by-step guide to perform x-ray photoelectron spectroscopy

• Published in: Journal of applied physics Vol. 132; no. 1
• Main Authors: Greczynski, Grzegorz, Hultman, Lars
• Format: Journal Article
• Language: English
• Published: Melville American Institute of Physics 07.07.2022
• Subjects: Applied physics; Chemical bonds; Data acquisition; Data analysis; Error analysis; Photoelectrons; Reliability aspects; Spectra; Spectrum analysis; Thin films; Workflow; X ray photoelectron spectroscopy
• ISSN: 0021-8979; 1089-7550; 1089-7550
• DOI: 10.1063/5.0086359

There is a growing concern within the surface science community that the massive increase in the number of XPS articles over the last few decades is accompanied by a decrease in work quality including in many cases meaningless chemical bond assignment. Should this trend continue, it would have disas...