Quantitative method of assessing the nature of local order from HREM images for SRO on crystalline sublattices

• Published in: Ultramicroscopy Vol. 52; no. 3; pp. 415 - 420
• Main Authors: Hytch, M.J., Chevalier, J.-P.
• Format: Journal Article Conference Proceeding
• Language: English
• Published: Amsterdam Elsevier B.V 01.12.1993; Elsevier Science
• Subjects: Electron, positron and ion microscopes, electron diffractometers and related techniques; Exact sciences and technology; Instruments, apparatus, components and techniques common to several branches of physics and astronomy; Physics; Scanning probe microscopes, components, and techniques; High resolution; Crystals; Sublattices; Mullite; Short-range order; Experimental study; Electron microscopy

We examine high resolution electron microscope (HREM) images of a silicon mullite using a quantitative technique of analysis previously proposed. The aim is to determine the nature of the short range order (SRO) of the oxygen atoms. The digitised images are Fourier-transformed and two images are rec...