Exploration of the temperature-dependent correlations present in the structural, morphological and electrical properties of thermally reduced free-standing graphene oxide papers

• Published in: Journal of materials science Vol. 56; no. 27; pp. 15134 - 15150
• Main Authors: Ramamoorthy, Harihara, Buapan, Kanokwan, Chiawchan, Tinna, Thamkrongart, Krongtham, Somphonsane, Ratchanok
• Format: Journal Article
• Language: English
• Published: New York Springer US 01.09.2021; Springer; Springer Nature B.V
• Subjects: Atomic force microscopy; carbon; Carbon content; Characterization and Evaluation of Materials; Chemical analysis; Chemistry and Materials Science; Classical Mechanics; Composites & Nanocomposites; Crystallography and Scattering Methods; Diffraction; Electric properties; Electrical properties; electrical resistance; Four point probe method; Fourier transform infrared spectroscopy; Fourier transforms; Graphene; graphene oxide; Graphite; Infrared analysis; Infrared spectroscopy; Materials Science; Mechanical properties; Microscopy; Morphology; oxygen; Polymer Sciences; Solid Mechanics; Structural analysis; Temperature; Temperature dependence; Thermal reduction; X-ray diffraction; X-rays

We report on a corroborative study of the structural, morphological and electrical property alterations of free-standing graphene oxide (GO) papers subject to thermal reduction. Structural analysis performed using Fourier transform infrared spectroscopy (FTIR), X-ray diffraction (XRD) and Raman tech...