Segregation of Si and Ti in α-alumina

• Published in: Materials letters Vol. 41; no. 4; pp. 198 - 203
• Main Authors: Kebbede, Anteneh, Carim, Altaf H
• Format: Journal Article
• Language: English
• Published: Amsterdam Elsevier B.V 01.11.1999; Elsevier
• Subjects: Alumina; Anisotropic; Condensed matter: structure, mechanical and thermal properties; Defects and impurities in crystals; microstructure; EDS; Exact sciences and technology; Impurities: concentration, distribution, and gradients; Impurity concentration, distribution, and gradients; Physics; Segregation; Silicon; Structure of solids and liquids; crystallography; Titania; Anisotropic; Silicon; Titania; Segregation; EDS; Alumina; Spectroscopy; Inorganic compounds; Binary compounds; Experimental study; Silicon additions; Titanium additions; Oxide ceramics; Energy dispersion; Impurities; Anisotropy; Microstructure; Impurity segregation; TEM; Codoping; Aluminium oxides

The segregation of Si and Ti in 0.6 wt.% TiO 2-doped α-Al 2O 3 containing ∼0.05 wt.% impurity Si was characterized. The material developed an anisotropic microstructure consisting of alumina platelets in an equiaxed matrix. Si collects to form an amorphous aluminosilicate layer at basal boundaries o...