Application of coincidence of reciprocal lattice point model to metal/sapphire hetero interfaces

• Published in: Materials science & engineering. B, Solid-state materials for advanced technology Vol. 173; no. 1; pp. 234 - 238
• Main Authors: Montesa, Christine Marie, Shibata, Naoya, Tohei, Tetsuya, Akiyama, Kazuhiro, Kuromitsu, Yoshirou, Ikuhara, Yuichi
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 15.10.2010
• Subjects: BCC metals; CRLP; Crystallographic orientation relationship; Epitaxy; Film growth; Geometrical coherency; Internal oxidation; Lattices; Materials science; Mathematical models; Metal/ceramic interface; Metal/sapphire interface; Orientation; Orientation relationships; Sapphire; Metal/sapphire interface; Crystallographic orientation relationship; CRLP; Epitaxy; Metal/ceramic interface; Geometrical coherency
• ISSN: 0921-5107; 1873-4944
• DOI: 10.1016/j.mseb.2009.12.023

Coincidence of reciprocal lattice point (CRLP) model was used to predict the stable orientation relationships of metal/α-Al 2O 3 hetero interfaces from geometrical considerations. The predicted stable orientation relationships (ORs) between various metals and α-Al 2O 3 agreed well with the experimentally observed ORs at the hetero interfaces fabricated by film growth processes. In the bcc metal/α-Al 2O 3 systems with different fabrication processes such as internal oxidation, Burgers and Pitsch–Schrader ORs were experimentally observed, which have not been predicted as the most stable orientation relationships by CRLP. However, these ORs are predicted in CRLP as secondary stable orientations.