In situ size-strain analysis of nanocrystalline ceria growth

• Published in: Materials science & engineering. A, Structural materials : properties, microstructure and processing Vol. 528; no. 1; pp. 77 - 82
• Main Authors: Scardi, P., Leoni, M., Müller, M., Di Maggio, R.
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 25.11.2010
• Subjects: Asymptotic properties; Ceria nanocrystals; Cerium; Cerium oxide; Coalescing; Diffraction; Growth kinetics; Line profile analysis; Materials science; Nanocrystalline materials; Nanocrystals; Nucleation; Precursors; Structural materials; X-ray diffraction; Xerogels; Line profile analysis; X-ray diffraction; Nanocrystalline materials; Growth kinetics; Ceria nanocrystals

A xerogel produced from cerium isopropoxide is shown to be made of nanocrystalline ceria domains (ca. 2 nm in diameter), already formed by condensation of the hydrolysed precursor. In situ isothermal X-ray diffraction studies of the xerogel calcination reveal the occurrence of a second stage of nucl...