Simultaneous testing for the successive differences of exponential location parameters under heteroscedasticity

• Published in: Statistics & probability letters Vol. 81; no. 10; pp. 1507 - 1517
• Main Authors: Maurya, Vishal, Goyal, Anju, Gill, Amar Nath
• Format: Journal Article
• Language: English
• Published: Amsterdam Elsevier B.V 01.10.2011; Elsevier
• Series: Statistics & Probability Letters
• Subjects: Bonferroni inequality; Exact sciences and technology; Experimental design; General topics; Heteroscedasticity; Mathematics; Multivariate analysis; One-stage procedure; Probability and statistics; Probability theory and stochastic processes; Sciences and techniques of general use; Statistics; Two-parameter exponential distribution; Two-parameter exponential distribution Two-stage procedure One-stage procedure Bonferroni inequality Heteroscedasticity; Two-stage procedure; Two-stage procedure; Bonferroni inequality; Two-parameter exponential distribution; One-stage procedure; Heteroscedasticity; Rank statistic; Data analysis; Critical value; Exponential distribution; Probability theory; Gaussian distribution; Location parameter; Statistical estimation; Multiple comparison; Confidence interval; Statistical method; Statistical test; Simulation; Experimental design; Subset selection

In this paper, the design-oriented two-stage and data-analysis one-stage multiple comparison procedures for successive comparisons of exponential location parameters under heteroscedasticity are proposed. One-sided and two-sided simultaneous confidence intervals are also given. We also extend these...