An analytical model of electronic fault diagnosis on extension of the dependency theory

• Published in: Reliability engineering & system safety Vol. 133; pp. 192 - 202
• Main Authors: Cui, Yiqian, Shi, Junyou, Wang, Zili
• Format: Journal Article
• Language: English
• Published: Oxford Elsevier Ltd 01.01.2015; Elsevier
• Subjects: Applied sciences; Avionics; Binary programming; Diagnosis; Electronic systems; Electronics; Exact sciences and technology; Fault diagnosis; Improved dependency model; Industrial metrology. Testing; Logic; Mathematical analysis; Mathematical models; Mathematical programming; Mechanical engineering. Machine design; Multiple fault diagnosis; Operational research and scientific management; Operational research. Management science; Optimization; Propagated faults; Reliability engineering; Reliability theory. Replacement problems; Testing, measurement, noise and reliability; Improved dependency model; Propagated faults; Electronic systems; Binary programming; Multiple fault diagnosis; Performance evaluation; Dependability; Complex system; Modeling; Avionics; Zero one programming; Optimal solution; Objective function; Fault diagnostic; Mathematical programming

Based on the D-matrix model, the dependency theory is widely used in the field of fault diagnosis to model the fault flows in complex electronic systems. However, the traditional dependency model can only handle a single fault; it fails to recognize and diagnose multiple faults. In addition, it is n...