Work function shifts of catalytic metals under hydrogen gas visualized by terahertz chemical microscopy

Terahertz chemical microscopy (TCM) was applied to visualize the distribution of the work function shift of catalytic metals under hydrogen gas. TCM measures the chemical potential on the surface of a SiO(2)/Si/sapphire sensing plate without any contact with the plate. By controlling the bias voltag...

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Bibliographic Details
Published inOptics express Vol. 20; no. 11; pp. 11637 - 11642
Main Authors Kiwa, Toshihiko, Hagiwara, Takafumi, Shinomiya, Mitsuhiro, Sakai, Kenji, Tsukada, Keiji
Format Journal Article
LanguageEnglish
Published United States 21.05.2012
Subjects
Catalysis
Energy Transfer
Hydrogen - chemistry
Metals - analysis
Metals - chemistry
Microscopy - methods
Terahertz Imaging - methods
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Summary:Terahertz chemical microscopy (TCM) was applied to visualize the distribution of the work function shift of catalytic metals under hydrogen gas. TCM measures the chemical potential on the surface of a SiO(2)/Si/sapphire sensing plate without any contact with the plate. By controlling the bias voltage between an electrode on the SiO(2)/ surface and the Si layer, the relationship between the voltage and the THz amplitude from the sensing plate can be obtained. As a demonstration, two types of structures were fabricated on the sensing plate, and the work function shifts due to catalytic reactions were visualized.
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ISSN:1094-4087
1094-4087
DOI:10.1364/oe.20.011637