Dual-Tree Complex Wavelet Transform and Twin Support Vector Machine for Pathological Brain Detection - Wang, Shuihua; Lu, Siyuan; Dong, Zhengchao; Yang, Jiquan; Yang, Ming; Zhang, Yudong (Applied sciences, 2016)
Keywords: Accuracy; Advanced manufacturing technologies; Alzheimer's disease; Brain; Brain cancer; Classification; Decomposition; dual-tree complex wavelet transform; Entropy; Image classification; Infectious diseases; Laboratories; Magnetic resonance imaging; Manufacturing; Methods; Neural networks; Neuroimaging; Parameter estimation; support vector machine; Support vector machines; Tumors; twin support vector machine; variance; Wavelet transforms; China