MODIS-based corn grain yield estimation model incorporating crop phenology information

A crop yield estimation model using time-series MODIS WDRVI was developed. The main feature of the proposed model is the incorporation of crop phenology detection using MODIS data, called the “Shape-Model Fitting Method”. MODIS WDRVI taken 7–10days before the corn silking stage had strong linear cor...

Full description

Saved in:
Bibliographic Details
Published inRemote sensing of environment Vol. 131; pp. 215 - 231
Main Authors Sakamoto, Toshihiro, Gitelson, Anatoly A., Arkebauer, Timothy J.
Format Journal Article
LanguageEnglish
Published New York, NY Elsevier Inc 15.04.2013
Elsevier
Subjects
Online AccessGet full text

Cover

Loading…
More Information
Summary:A crop yield estimation model using time-series MODIS WDRVI was developed. The main feature of the proposed model is the incorporation of crop phenology detection using MODIS data, called the “Shape-Model Fitting Method”. MODIS WDRVI taken 7–10days before the corn silking stage had strong linear correlation with corn final grain yield at both field and regional scales. The model revealed spatial patterns of corn final grain yield all over the U.S. from 2000 to 2011. State-level corn yield was estimated accurately with coefficient of variation below 10% especially for the 18 major corn producing states including Iowa, Illinois, Delaware, Minnesota, Ohio, West Virginia, Wisconsin, Michigan, Indiana, Nebraska, Kentucky, New York, South Dakota, Missouri, Pennsylvania, Tennessee, New Jersey and Maryland. The results corresponded well with the spatial pattern of high-yield regions derived from the USDA/NASS data. However, the model tended to underestimate corn grain yield in three irrigated regions: the Midwestern region depending on the Ogallala Aquifer, the downstream basin of the Mississippi, and the southwestern region of Georgia. In contrast, it tended to overestimate corn grain yield around the outlying regions of the U.S. Corn Belt, specifically, the East Coast, North Dakota, Minnesota, Wisconsin, and Missouri. The estimation accuracy of the proposed model differed depending on the region. However, the annual variation of state level corn grain yield could be detected with high accuracy, especially in the major corn producing states. ► A corn yield estimation model was developed by incorporating a crop phenology detection method. ► Model calibration and validation were conducted on both field and regional scales. ► WDRVI taken 7–10days before silking stage accurately estimated corn grain yield. ► The model revealed spatial patterns of corn grain yield all over the U.S. for over a decade.
ISSN:0034-4257
1879-0704
DOI:10.1016/j.rse.2012.12.017