APA (7th ed.) Citation

Yu, Y., Lin, G., Jiang, I. H., & Chiang, C. (2015). Machine-Learning-Based Hotspot Detection Using Topological Classification and Critical Feature Extraction. IEEE transactions on computer-aided design of integrated circuits and systems, 34(3), 460-470. https://doi.org/10.1109/TCAD.2014.2387858

Chicago Style (17th ed.) Citation

Yu, Yen-Ting, Geng-He Lin, Iris Hui-Ru Jiang, and Charles Chiang. "Machine-Learning-Based Hotspot Detection Using Topological Classification and Critical Feature Extraction." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems 34, no. 3 (2015): 460-470. https://doi.org/10.1109/TCAD.2014.2387858.

MLA (9th ed.) Citation

Yu, Yen-Ting, et al. "Machine-Learning-Based Hotspot Detection Using Topological Classification and Critical Feature Extraction." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems, vol. 34, no. 3, 2015, pp. 460-470, https://doi.org/10.1109/TCAD.2014.2387858.