On a Markov-modulated shock and wear process
We present transient and asymptotic reliability indices for a single‐unit system that is subject to Markov‐modulated shocks and wear. The transient results are derived from the (transform) solution of an integro‐differential equation describing the joint distribution of the cumulative degradation pr...
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Published in | Naval research logistics Vol. 56; no. 6; pp. 563 - 576 |
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Abstract | We present transient and asymptotic reliability indices for a single‐unit system that is subject to Markov‐modulated shocks and wear. The transient results are derived from the (transform) solution of an integro‐differential equation describing the joint distribution of the cumulative degradation process and the state of the modulating process. Additionally, we prove the asymptotic normality of a properly centered and time‐scaled version of the cumulative degradation at time t. This asymptotic result leads to a simple normal approximation for a properly centered and space‐scaled version of the systes lifetime distribution. Two numerical examples illustrate the quality of the normal approximation. © 2009 Wiley Periodicals, Inc. Naval Research Logistics 2009 |
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AbstractList | We present transient and asymptotic reliability indices for a single-unit system that is subject to Markov-modulated shocks and wear. The transient results are derived from the (transform) solution of an integro-differential equation describing the joint distribution of the cumulative degradation process and the state of the modulating process. Additionally, we prove the asymptotic normality of a properly centered and time-scaled version of the cumulative degradation at time t. This asymptotic result leads to a simple normal approximation for a properly centered and space-scaled version of the systes lifetime distribution. Two numerical examples illustrate the quality of the normal approximation. We present transient and asymptotic reliability indices for a single‐unit system that is subject to Markov‐modulated shocks and wear. The transient results are derived from the (transform) solution of an integro‐differential equation describing the joint distribution of the cumulative degradation process and the state of the modulating process. Additionally, we prove the asymptotic normality of a properly centered and time‐scaled version of the cumulative degradation at time t. This asymptotic result leads to a simple normal approximation for a properly centered and space‐scaled version of the systes lifetime distribution. Two numerical examples illustrate the quality of the normal approximation. © 2009 Wiley Periodicals, Inc. Naval Research Logistics 2009 We present transient and asymptotic reliability indices for a single‐unit system that is subject to Markov‐modulated shocks and wear. The transient results are derived from the (transform) solution of an integro‐differential equation describing the joint distribution of the cumulative degradation process and the state of the modulating process. Additionally, we prove the asymptotic normality of a properly centered and time‐scaled version of the cumulative degradation at time t . This asymptotic result leads to a simple normal approximation for a properly centered and space‐scaled version of the systes lifetime distribution. Two numerical examples illustrate the quality of the normal approximation. © 2009 Wiley Periodicals, Inc. Naval Research Logistics 2009 |
Author | Kharoufeh, Jeffrey P. Mixon, Dustin G. |
Author_xml | – sequence: 1 givenname: Jeffrey P. surname: Kharoufeh fullname: Kharoufeh, Jeffrey P. email: jkharouf@pitt.edu organization: Department of Industrial Engineering, University of Pittsburgh, Pittsburgh, Pennsylvania 15261 USA – sequence: 2 givenname: Dustin G. surname: Mixon fullname: Mixon, Dustin G. organization: Air Force Research Laboratory, HE Directorate, Directed Energy Bioeffects Division, RF Radiation Branch, Brooks City-Base, Texas 78235 |
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Cites_doi | 10.1239/jap/996986754 10.1098/rspa.1955.0198 10.1016/0304-4149(89)90048-3 10.1239/jap/1032374629 10.1002/nav.20068 10.1080/15326340500481713 10.1017/S0269964800004204 10.2307/3215132 10.1214/ss/1177010132 10.1109/TR.2002.802891 10.2307/3213388 10.1016/0166-5316(93)90035-S 10.1287/ijoc.7.1.36 10.1239/jap/1152413724 10.1016/0304-4149(93)90019-Z 10.2307/3213896 10.1016/S0167-6377(02)00229-8 10.1214/aop/1176996891 10.2307/3212849 10.1080/07408170590929009 10.1239/jap/1014843073 10.1080/07408170590929018 10.1239/jap/1037816013 10.1137/0122011 10.1016/S0304-4149(01)00146-6 |
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