Mapping the mesoscale interface structure in polycrystalline materials - Wu, C.T; Adams, B.L; Bauer, C.L; Casasent, D; Morawiec, A; Ozdemir, S; Talukder, A (Ultramicroscopy, 2002)
Keywords: Condensed matter: structure, mechanical and thermal properties; Defects and impurities in crystals; microstructure; Electron backscatter diffraction patterns; Exact sciences and technology; Grain and twin boundaries; Instruments, apparatus, components and techniques common to several branches of physics and astronomy; Orientation imaging microscopy; Physics; Scanning probe microscopes, components and techniques; Structure of solids and liquids; crystallography; Triple junctions; Orientation imaging microscopy; 60; Electron backscatter diffraction patterns; Triple junctions; 61.72.Mm Subject index terms: 014; 61.14.Bg; Interface structure; Scanning electron microscopy; Electron backscattering; Mesoscale; Electron diffraction; Polycrystals; Experimental study; Microstructure; Quantitative chemical analysis