Foreword for the special issue on the Tenth International Workshop on Low Energy Electron Microscopy and Photoemission Electron Microscopy

• Published in: Ultramicroscopy Vol. 183; no. C; p. 1
• Main Authors: Schmid, Andreas, Scholl, Andreas
• Format: Journal Article
• Language: English
• Published: Netherlands Elsevier B.V 01.12.2017; Elsevier
• Subjects: GENERAL AND MISCELLANEOUS

The Tenth International Workshop on Low Energy Electron Microscopy and Photoemission Electron Microscopy (LEEM/PEEM-10) was hosted in Monterey, California on September 11–15, 2016. This Workshop marked the 18th anniversary of the LEEM/PEEM series. The inaugural LEEM Workshop was organized by Ernst B...