APA (7th ed.) Citation

Jang, S. Y., Shin, J., Hwang, E. J., Choi, H., Jeong, H., Song, S., & Kwon, H. (2014). Investigation of Buffer Traps in AlGaN/GaN Heterostructure Field-Effect Transistors Using a Simple Test Structure. Journal of semiconductor technology and science, 14(4), 478-483. https://doi.org/10.5573/JSTS.2014.14.4.478

Chicago Style (17th ed.) Citation

Jang, Seung Yup, Jong-Hoon Shin, Eu Jin Hwang, Hyo-Seung Choi, Hun Jeong, Sang-Hun Song, and Hyuck-In Kwon. "Investigation of Buffer Traps in AlGaN/GaN Heterostructure Field-Effect Transistors Using a Simple Test Structure." Journal of Semiconductor Technology and Science 14, no. 4 (2014): 478-483. https://doi.org/10.5573/JSTS.2014.14.4.478.

MLA (9th ed.) Citation

Jang, Seung Yup, et al. "Investigation of Buffer Traps in AlGaN/GaN Heterostructure Field-Effect Transistors Using a Simple Test Structure." Journal of Semiconductor Technology and Science, vol. 14, no. 4, 2014, pp. 478-483, https://doi.org/10.5573/JSTS.2014.14.4.478.