APA (7th ed.) Citation

Sharma, S., Turkeshi, X., Fazio, R., & Dalmonte, M. (2022). Measurement-induced criticality in extended and long-range unitary circuits. SciPost physics core, 5(2), 023. https://doi.org/10.21468/SciPostPhysCore.5.2.023

Chicago Style (17th ed.) Citation

Sharma, Shraddha, Xhek Turkeshi, Rosario Fazio, and Marcello Dalmonte. "Measurement-induced Criticality in Extended and Long-range Unitary Circuits." SciPost Physics Core 5, no. 2 (2022): 023. https://doi.org/10.21468/SciPostPhysCore.5.2.023.

MLA (9th ed.) Citation

Sharma, Shraddha, et al. "Measurement-induced Criticality in Extended and Long-range Unitary Circuits." SciPost Physics Core, vol. 5, no. 2, 2022, p. 023, https://doi.org/10.21468/SciPostPhysCore.5.2.023.