Echeverri-Ocampo, I., Ardila, K., Molina-Mateo, J., Padilla-Buritica, J. I., Carceller, H., Barceló-Martinez, E. A., . . . Iglesia-Vaya, M. d. l. (2023). EEG-Based Functional Connectivity Analysis for Cognitive Impairment Classification. Electronics (Basel), 12(21), 4432. https://doi.org/10.3390/electronics12214432
Chicago Style (17th ed.) CitationEcheverri-Ocampo, Isabel, Karen Ardila, José Molina-Mateo, J. I. Padilla-Buritica, Héctor Carceller, Ernesto A. Barceló-Martinez, S. I. Llamur, and Maria de la Iglesia-Vaya. "EEG-Based Functional Connectivity Analysis for Cognitive Impairment Classification." Electronics (Basel) 12, no. 21 (2023): 4432. https://doi.org/10.3390/electronics12214432.
MLA (9th ed.) CitationEcheverri-Ocampo, Isabel, et al. "EEG-Based Functional Connectivity Analysis for Cognitive Impairment Classification." Electronics (Basel), vol. 12, no. 21, 2023, p. 4432, https://doi.org/10.3390/electronics12214432.