FeMn Exchange Biased Storage Layer for Thermally Assisted MRAM

Thermally assisted MRAM cells with FeMn exchange biased storage layers were successfully written using 50 ns current pulses with write power densities below 10 mW/¿m 2 and current densities below 1.3 ×10 6 A/cm 2 . These low power density values were achieved without using thermal barriers to confin...

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Published inIEEE transactions on magnetics Vol. 46; no. 6; pp. 2486 - 2488
Main Authors Gapihan, Erwan, Mackay, Ken, Nozieres, Jean-Pierre, Sousa, Ricardo C., Herault, Jeremy, Papusoi, Christian, Delaye, Marie Therese, Dieny, Bernard, Prejbeanu, I. Lucien, Ducruet, Clarisse, Portemont, Céline
Format Journal Article Conference Proceeding
LanguageEnglish
Published New York, NY IEEE 01.06.2010
Institute of Electrical and Electronics Engineers
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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Abstract Thermally assisted MRAM cells with FeMn exchange biased storage layers were successfully written using 50 ns current pulses with write power densities below 10 mW/¿m 2 and current densities below 1.3 ×10 6 A/cm 2 . These low power density values were achieved without using thermal barriers to confine the heat in the cell. Introducing thermal barriers would even further lower the write power density by increasing the heating efficiency. The storage layer coercivity increased upon anneal at 340 C. This could be related to manganese diffusion or to a texture incompatibility between the CoFe and the FeMn antiferromagnetic layer, a problem which can be fixed by insertion of appropriate diffusion barrier or texture control layer. Successful writing was observed for repeated write attempts with heating pulse power densities in the 7-12.5 mW/¿m 2 range.
AbstractList Thermally assisted MRAM cells with FeMn exchange biased storage layers were successfully written using 50 ns current pulses with write power densities below 10 mW/¿m 2 and current densities below 1.3 ×10 6 A/cm 2 . These low power density values were achieved without using thermal barriers to confine the heat in the cell. Introducing thermal barriers would even further lower the write power density by increasing the heating efficiency. The storage layer coercivity increased upon anneal at 340 C. This could be related to manganese diffusion or to a texture incompatibility between the CoFe and the FeMn antiferromagnetic layer, a problem which can be fixed by insertion of appropriate diffusion barrier or texture control layer. Successful writing was observed for repeated write attempts with heating pulse power densities in the 7-12.5 mW/¿m 2 range.
Thermally assisted MRAM cells with FeMn exchange biased storage layers were successfully written using 50 ns current pulses with write power densities below 10 [Formula Omitted] and current densities below [Formula Omitted]. These low power density values were achieved without using thermal barriers to confine the heat in the cell. Introducing thermal barriers would even further lower the write power density by increasing the heating efficiency. The storage layer coercivity increased upon anneal at 340 C. This could be related to manganese diffusion or to a texture incompatibility between the CoFe and the FeMn antiferromagnetic layer, a problem which can be fixed by insertion of appropriate diffusion barrier or texture control layer. Successful writing was observed for repeated write attempts with heating pulse power densities in the 7-12.5 [Formula Omitted] range.
Thermally assisted MRAM cells with FeMn exchange biased storage layers were successfully written using 50 ns current pulses with write power densities below 10 hbox mW / mu hbox m 2 and current densities below 1.3 10 6 Unknown character hbox A / cm 2 . These low power density values were achieved without using thermal barriers to confine the heat in the cell. Introducing thermal barriers would even further lower the write power density by increasing the heating efficiency. The storage layer coercivity increased upon anneal at 340 C. This could be related to manganese diffusion or to a texture incompatibility between the CoFe and the FeMn antiferromagnetic layer, a problem which can be fixed by insertion of appropriate diffusion barrier or texture control layer. Successful writing was observed for repeated write attempts with heating pulse power densities in the 7-12.5 hbox mW / mu hbox m 2 range.
Author Gapihan, Erwan
Nozieres, Jean-Pierre
Prejbeanu, I. Lucien
Portemont, Céline
Dieny, Bernard
Ducruet, Clarisse
Herault, Jeremy
Papusoi, Christian
Mackay, Ken
Sousa, Ricardo C.
Delaye, Marie Therese
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Issue 6
Keywords Magnetic hysteresis
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Magnetic semiconductors
Magnetic properties
Language English
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References cardoso (ref7) 2006; 99
lombard (ref8) 2010
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Snippet Thermally assisted MRAM cells with FeMn exchange biased storage layers were successfully written using 50 ns current pulses with write power densities below 10...
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StartPage 2486
SubjectTerms Annealing
Antiferromagnetic materials
Coercive force
Cross-disciplinary physics: materials science; rheology
Current density
Density
Diffusion barriers
Electrodes
Engineering Sciences
Exact sciences and technology
Heating
Magnetic fields
Magnetic hysteresis
magnetic semiconductors
Magnetism
Magnetoresistive random access memory
Materials science
Other topics in materials science
Physics
Plasma temperature
Space vector pulse width modulation
Surface layer
Texture
Thermal barriers
Thermal stability
Writing
Title FeMn Exchange Biased Storage Layer for Thermally Assisted MRAM
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