FeMn Exchange Biased Storage Layer for Thermally Assisted MRAM
Thermally assisted MRAM cells with FeMn exchange biased storage layers were successfully written using 50 ns current pulses with write power densities below 10 mW/¿m 2 and current densities below 1.3 ×10 6 A/cm 2 . These low power density values were achieved without using thermal barriers to confin...
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Published in | IEEE transactions on magnetics Vol. 46; no. 6; pp. 2486 - 2488 |
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Main Authors | , , , , , , , , , , |
Format | Journal Article Conference Proceeding |
Language | English |
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New York, NY
IEEE
01.06.2010
Institute of Electrical and Electronics Engineers The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
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Abstract | Thermally assisted MRAM cells with FeMn exchange biased storage layers were successfully written using 50 ns current pulses with write power densities below 10 mW/¿m 2 and current densities below 1.3 ×10 6 A/cm 2 . These low power density values were achieved without using thermal barriers to confine the heat in the cell. Introducing thermal barriers would even further lower the write power density by increasing the heating efficiency. The storage layer coercivity increased upon anneal at 340 C. This could be related to manganese diffusion or to a texture incompatibility between the CoFe and the FeMn antiferromagnetic layer, a problem which can be fixed by insertion of appropriate diffusion barrier or texture control layer. Successful writing was observed for repeated write attempts with heating pulse power densities in the 7-12.5 mW/¿m 2 range. |
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AbstractList | Thermally assisted MRAM cells with FeMn exchange biased storage layers were successfully written using 50 ns current pulses with write power densities below 10 mW/¿m 2 and current densities below 1.3 ×10 6 A/cm 2 . These low power density values were achieved without using thermal barriers to confine the heat in the cell. Introducing thermal barriers would even further lower the write power density by increasing the heating efficiency. The storage layer coercivity increased upon anneal at 340 C. This could be related to manganese diffusion or to a texture incompatibility between the CoFe and the FeMn antiferromagnetic layer, a problem which can be fixed by insertion of appropriate diffusion barrier or texture control layer. Successful writing was observed for repeated write attempts with heating pulse power densities in the 7-12.5 mW/¿m 2 range. Thermally assisted MRAM cells with FeMn exchange biased storage layers were successfully written using 50 ns current pulses with write power densities below 10 [Formula Omitted] and current densities below [Formula Omitted]. These low power density values were achieved without using thermal barriers to confine the heat in the cell. Introducing thermal barriers would even further lower the write power density by increasing the heating efficiency. The storage layer coercivity increased upon anneal at 340 C. This could be related to manganese diffusion or to a texture incompatibility between the CoFe and the FeMn antiferromagnetic layer, a problem which can be fixed by insertion of appropriate diffusion barrier or texture control layer. Successful writing was observed for repeated write attempts with heating pulse power densities in the 7-12.5 [Formula Omitted] range. Thermally assisted MRAM cells with FeMn exchange biased storage layers were successfully written using 50 ns current pulses with write power densities below 10 hbox mW / mu hbox m 2 and current densities below 1.3 10 6 Unknown character hbox A / cm 2 . These low power density values were achieved without using thermal barriers to confine the heat in the cell. Introducing thermal barriers would even further lower the write power density by increasing the heating efficiency. The storage layer coercivity increased upon anneal at 340 C. This could be related to manganese diffusion or to a texture incompatibility between the CoFe and the FeMn antiferromagnetic layer, a problem which can be fixed by insertion of appropriate diffusion barrier or texture control layer. Successful writing was observed for repeated write attempts with heating pulse power densities in the 7-12.5 hbox mW / mu hbox m 2 range. |
Author | Gapihan, Erwan Nozieres, Jean-Pierre Prejbeanu, I. Lucien Portemont, Céline Dieny, Bernard Ducruet, Clarisse Herault, Jeremy Papusoi, Christian Mackay, Ken Sousa, Ricardo C. Delaye, Marie Therese |
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SubjectTerms | Annealing Antiferromagnetic materials Coercive force Cross-disciplinary physics: materials science; rheology Current density Density Diffusion barriers Electrodes Engineering Sciences Exact sciences and technology Heating Magnetic fields Magnetic hysteresis magnetic semiconductors Magnetism Magnetoresistive random access memory Materials science Other topics in materials science Physics Plasma temperature Space vector pulse width modulation Surface layer Texture Thermal barriers Thermal stability Writing |
Title | FeMn Exchange Biased Storage Layer for Thermally Assisted MRAM |
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