Temperature and pH dependence of the electroless Ni–P deposition on silicon
The sensitization, activation, nucleation and growth of electroless Ni–P deposition on silicon in an acid plating bath with sodium hydrophosphite as reducing agent and sodium succinate as complexing agent were studied by transmission electron microscopy, field emission scanning electron microscopy a...
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Published in | Thin solid films Vol. 510; no. 1; pp. 102 - 106 |
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Main Authors | , , , , |
Format | Journal Article |
Language | English |
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Elsevier B.V
03.07.2006
Elsevier Science |
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Abstract | The sensitization, activation, nucleation and growth of electroless Ni–P deposition on silicon in an acid plating bath with sodium hydrophosphite as reducing agent and sodium succinate as complexing agent were studied by transmission electron microscopy, field emission scanning electron microscopy and atomic force microscopy. The results show that a continuous polycrystalline SnCl
2 film was formed on the silicon surface in the sensitization process, and small crystalline Pd particles were dispersedly produced on SnCl
2 film in the activation process. In the initial deposition stage, the small Ni–P particles had already emerged on the silicon surface in a deposition time of less than 2 s. When Ni–P particles grew, their size increased but their number decreased, and they later developed into a columnar structure. The deposition rate of the electroless Ni–P deposit increased as the pH value and the temperature of the plating bath increased (from 1.36 to 29.66 μm/h). The activation energy of the electroless Ni–P deposition on silicon increased as the pH value of the plating bath decreased (from 68.8 to 79.4 kJ/mol). |
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AbstractList | The sensitization, activation, nucleation and growth of electroless Ni–P deposition on silicon in an acid plating bath with sodium hydrophosphite as reducing agent and sodium succinate as complexing agent were studied by transmission electron microscopy, field emission scanning electron microscopy and atomic force microscopy. The results show that a continuous polycrystalline SnCl
2 film was formed on the silicon surface in the sensitization process, and small crystalline Pd particles were dispersedly produced on SnCl
2 film in the activation process. In the initial deposition stage, the small Ni–P particles had already emerged on the silicon surface in a deposition time of less than 2 s. When Ni–P particles grew, their size increased but their number decreased, and they later developed into a columnar structure. The deposition rate of the electroless Ni–P deposit increased as the pH value and the temperature of the plating bath increased (from 1.36 to 29.66 μm/h). The activation energy of the electroless Ni–P deposition on silicon increased as the pH value of the plating bath decreased (from 68.8 to 79.4 kJ/mol). The sensitization, activation, nucleation and growth of electroless Ni-P deposition on silicon in an acid plating bath with sodium hydrophosphite as reducing agent and sodium succinate as complexing agent were studied by transmission electron microscopy, field emission scanning electron microscopy and atomic force microscopy. The results show that a continuous polycrystalline SnCl2 film was formed on the silicon surface in the sensitization process, and small crystalline Pd particles were dispersedly produced on SnCl2 film in the activation process. In the initial deposition stage, the small Ni-P particles had already emerged on the silicon surface in a deposition time of less than 2 s. When Ni-P particles grew, their size increased but their number decreased, and they later developed into a columnar structure. The deposition rate of the electroless Ni-P deposit increased as the pH value and the temperature of the plating bath increased (from 1.36 to 29.66 D*mm/h). The activation energy of the electroless Ni-P deposition on silicon increased as the pH value of the plating bath decreased (from 68.8 to 79.4 kJ/mol). |
Author | Liu, W.L. Hsieh, S.H. Tsai, T.K. Wu, Shin Shyan Chen, W.J. |
Author_xml | – sequence: 1 givenname: W.L. surname: Liu fullname: Liu, W.L. organization: Department of Materials Science and Engineering, National Formosa University of Science and Technology, 64 Wunhua Road, huwei, Yunlin 632, Taiwan – sequence: 2 givenname: S.H. surname: Hsieh fullname: Hsieh, S.H. organization: Department of Materials Science and Engineering, National Formosa University of Science and Technology, 64 Wunhua Road, huwei, Yunlin 632, Taiwan – sequence: 3 givenname: T.K. surname: Tsai fullname: Tsai, T.K. email: dktsai@sunws.nfu.edu.tw organization: Department of Materials Science and Engineering, National Formosa University of Science and Technology, 64 Wunhua Road, huwei, Yunlin 632, Taiwan – sequence: 4 givenname: W.J. surname: Chen fullname: Chen, W.J. organization: Graduate Institute of Materials Engineering, National Pingtung University of Science and Technology, 1, Shuehfu Road, Neipu, Pingtung 912, Taiwan – sequence: 5 givenname: Shin Shyan surname: Wu fullname: Wu, Shin Shyan organization: Institute of Electro-Optical and Materials Science, National Formosa University of Science and Technology, 64 Wunhua Road, huwei, Yunlin 632, Taiwan |
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Cites_doi | 10.1016/S0013-4686(00)00442-4 10.1149/1.1393575 10.1016/S0167-9317(99)00323-8 10.1149/1.2404059 10.1016/0040-6090(79)90358-4 10.1149/1.1837663 10.1149/1.2085771 10.1016/S1359-6454(99)00371-7 10.1016/0169-4332(94)00564-8 10.1149/1.1838153 10.1080/00202967.1998.11871206 10.1016/S0169-4332(01)00247-1 10.1149/1.2119616 10.1016/0254-0584(93)90176-M 10.1016/0040-6090(84)90448-6 10.1149/1.2129523 10.1016/S0924-0136(01)01021-4 10.1016/S0257-8972(03)00866-1 10.6028/jres.037.019 10.1149/1.2115541 10.1016/S0169-4332(01)00982-5 10.1016/j.apsusc.2004.03.014 10.1116/1.590440 10.1149/1.1793691 |
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Keywords | Scanning electron microscopy Nickel Electroless deposition Temperature dependence Atomic force microscopy Particle size Inorganic compounds Nucleation Thick films Polycrystals Experimental study Field emission electron microscopy Columnar structure Growth kinetic Transmission electron microscopy Growth mechanism Crystal growth from solutions Electrodeposition Activation energy |
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References | Liu, Hsieh, Tsai, Chen (bib26) 2004; 151 Wang, Fei, Yu, Zhao (bib22) 1995; 84 Lin, Jong (bib8) 1993; 35 Mallory, Hajdu (bib25) 1990 Shacham-Diamad, Sverdlov (bib16) 2000; 50 Haowen, Bangwei (bib14) 2002; 124 Rohan, O'Riordan, Boardman (bib20) 2002; 185 Tsai, Chao (bib12) 2004; 233 Ambat, Zhou (bib9) 2004; 179 Homma, Naito, Takai, Osaka, Yamazaki, Namikawa (bib2) 1991; 138 Wu, Hu, Zhang, Zhang (bib4) 1998; 76 Cachet, Froment, Souteyrand (bib13) 1989; 139 Homma, Tanabe, Itakura, Osaka (bib11) 1997; 144 Takano, Niwa, Yamada, Osaka (bib24) 2000; 45 Tada, Kanayama (bib15) 1998; 16 Backovic, Jancic, Radonjic (bib6) 1976; 59 Kordás, Remes, Leppävuori (bib23) 2001; 178 Flis, Duquette (bib3) 1984; 131 Szasz, Kojnok, Kertesz, Paal, Hegedus (bib7) 1983; 116 Brenner, Riddell (bib1) 1946; 27 Singh, Mitra (bib17) 1980; 127 Don, Popovici, Dascalu, Brezeanu, Popa (bib18) 1983; 130 Lin, Chen (bib21) 2000; 147 Hentschel, Isheim, Kirchheim, Müller, Kreye (bib10) 2000; 48 Lynch, Pehrsson, Leonard, Calvert (bib19) 1997; 144 Chow, Hedgecock, Schlesinger, Rezek (bib5) 1972; 119 Haowen (10.1016/j.tsf.2005.12.203_bib14) 2002; 124 Rohan (10.1016/j.tsf.2005.12.203_bib20) 2002; 185 Lynch (10.1016/j.tsf.2005.12.203_bib19) 1997; 144 Cachet (10.1016/j.tsf.2005.12.203_bib13) 1989; 139 Lin (10.1016/j.tsf.2005.12.203_bib8) 1993; 35 Singh (10.1016/j.tsf.2005.12.203_bib17) 1980; 127 Lin (10.1016/j.tsf.2005.12.203_bib21) 2000; 147 Szasz (10.1016/j.tsf.2005.12.203_bib7) 1983; 116 Ambat (10.1016/j.tsf.2005.12.203_bib9) 2004; 179 Takano (10.1016/j.tsf.2005.12.203_bib24) 2000; 45 Flis (10.1016/j.tsf.2005.12.203_bib3) 1984; 131 Backovic (10.1016/j.tsf.2005.12.203_bib6) 1976; 59 Chow (10.1016/j.tsf.2005.12.203_bib5) 1972; 119 Tsai (10.1016/j.tsf.2005.12.203_bib12) 2004; 233 Shacham-Diamad (10.1016/j.tsf.2005.12.203_bib16) 2000; 50 Hentschel (10.1016/j.tsf.2005.12.203_bib10) 2000; 48 Kordás (10.1016/j.tsf.2005.12.203_bib23) 2001; 178 Brenner (10.1016/j.tsf.2005.12.203_bib1) 1946; 27 Homma (10.1016/j.tsf.2005.12.203_bib2) 1991; 138 Wu (10.1016/j.tsf.2005.12.203_bib4) 1998; 76 Tada (10.1016/j.tsf.2005.12.203_bib15) 1998; 16 Wang (10.1016/j.tsf.2005.12.203_bib22) 1995; 84 Don (10.1016/j.tsf.2005.12.203_bib18) 1983; 130 Liu (10.1016/j.tsf.2005.12.203_bib26) 2004; 151 Homma (10.1016/j.tsf.2005.12.203_bib11) 1997; 144 Mallory (10.1016/j.tsf.2005.12.203_bib25) 1990 |
References_xml | – volume: 35 start-page: 53 year: 1993 ident: bib8 publication-title: Mater. Chem. Phys. contributor: fullname: Jong – volume: 119 start-page: 1614 year: 1972 ident: bib5 publication-title: J. Electrochem. Soc. contributor: fullname: Rezek – volume: 144 start-page: 4123 year: 1997 ident: bib11 publication-title: J. Electrochem. Soc. contributor: fullname: Osaka – volume: 151 start-page: C680 year: 2004 ident: bib26 publication-title: J. Electrochem. Soc. contributor: fullname: Chen – volume: 131 start-page: 51 year: 1984 ident: bib3 publication-title: J. Electrochem. Soc. contributor: fullname: Duquette – volume: 27 start-page: 31 year: 1946 ident: bib1 publication-title: J. Res. Natl. Bur. Stand. contributor: fullname: Riddell – volume: 16 start-page: 3934 year: 1998 ident: bib15 publication-title: J. Vac. Sci. Technol., B contributor: fullname: Kanayama – start-page: 98 year: 1990 ident: bib25 publication-title: Electroless Plating: Fundamentals and Application contributor: fullname: Hajdu – volume: 76 start-page: 108 year: 1998 ident: bib4 publication-title: Trans. Inst. Met. Finish. contributor: fullname: Zhang – volume: 179 start-page: 124 year: 2004 ident: bib9 publication-title: Surf. Coat. Technol. contributor: fullname: Zhou – volume: 127 start-page: 2578 year: 1980 ident: bib17 publication-title: J. Electrochem. Soc. contributor: fullname: Mitra – volume: 178 start-page: 93 year: 2001 ident: bib23 publication-title: Appl. Surf. Sci. contributor: fullname: Leppävuori – volume: 130 start-page: 2472 year: 1983 ident: bib18 publication-title: J. Electrochem. Soc. contributor: fullname: Popa – volume: 139 start-page: 462 year: 1989 ident: bib13 publication-title: J. Electrochem. Soc. contributor: fullname: Souteyrand – volume: 144 start-page: 1698 year: 1997 ident: bib19 publication-title: J. Electrochem. Soc. contributor: fullname: Calvert – volume: 48 start-page: 933 year: 2000 ident: bib10 publication-title: Acta Mater. contributor: fullname: Kreye – volume: 233 start-page: 180 year: 2004 ident: bib12 publication-title: Appl. Surf. Sci. contributor: fullname: Chao – volume: 45 start-page: 3263 year: 2000 ident: bib24 publication-title: Electrochim. Acta contributor: fullname: Osaka – volume: 147 start-page: 2604 year: 2000 ident: bib21 publication-title: J. Electrochem. Soc. contributor: fullname: Chen – volume: 116 start-page: 279 year: 1983 ident: bib7 publication-title: Thin Solid Films contributor: fullname: Hegedus – volume: 59 start-page: 1 year: 1976 ident: bib6 publication-title: Thin Solid Films contributor: fullname: Radonjic – volume: 185 start-page: 289 year: 2002 ident: bib20 publication-title: Appl. Surf. Sci. contributor: fullname: Boardman – volume: 124 start-page: 8 year: 2002 ident: bib14 publication-title: J. Mater. Process. Technol. contributor: fullname: Bangwei – volume: 84 start-page: 383 year: 1995 ident: bib22 publication-title: Appl. Surf. Sci. contributor: fullname: Zhao – volume: 50 start-page: 525 year: 2000 ident: bib16 publication-title: Microelectron. Eng. contributor: fullname: Sverdlov – volume: 138 start-page: 1269 year: 1991 ident: bib2 publication-title: J. Electrochem. Soc. contributor: fullname: Namikawa – volume: 45 start-page: 3263 year: 2000 ident: 10.1016/j.tsf.2005.12.203_bib24 publication-title: Electrochim. Acta doi: 10.1016/S0013-4686(00)00442-4 contributor: fullname: Takano – volume: 147 start-page: 2604 year: 2000 ident: 10.1016/j.tsf.2005.12.203_bib21 publication-title: J. Electrochem. Soc. doi: 10.1149/1.1393575 contributor: fullname: Lin – volume: 50 start-page: 525 year: 2000 ident: 10.1016/j.tsf.2005.12.203_bib16 publication-title: Microelectron. Eng. doi: 10.1016/S0167-9317(99)00323-8 contributor: fullname: Shacham-Diamad – volume: 119 start-page: 1614 year: 1972 ident: 10.1016/j.tsf.2005.12.203_bib5 publication-title: J. Electrochem. Soc. doi: 10.1149/1.2404059 contributor: fullname: Chow – volume: 59 start-page: 1 year: 1976 ident: 10.1016/j.tsf.2005.12.203_bib6 publication-title: Thin Solid Films doi: 10.1016/0040-6090(79)90358-4 contributor: fullname: Backovic – volume: 144 start-page: 1698 year: 1997 ident: 10.1016/j.tsf.2005.12.203_bib19 publication-title: J. Electrochem. Soc. doi: 10.1149/1.1837663 contributor: fullname: Lynch – volume: 138 start-page: 1269 year: 1991 ident: 10.1016/j.tsf.2005.12.203_bib2 publication-title: J. Electrochem. Soc. doi: 10.1149/1.2085771 contributor: fullname: Homma – volume: 48 start-page: 933 year: 2000 ident: 10.1016/j.tsf.2005.12.203_bib10 publication-title: Acta Mater. doi: 10.1016/S1359-6454(99)00371-7 contributor: fullname: Hentschel – volume: 139 start-page: 462 year: 1989 ident: 10.1016/j.tsf.2005.12.203_bib13 publication-title: J. Electrochem. Soc. contributor: fullname: Cachet – volume: 84 start-page: 383 year: 1995 ident: 10.1016/j.tsf.2005.12.203_bib22 publication-title: Appl. Surf. Sci. doi: 10.1016/0169-4332(94)00564-8 contributor: fullname: Wang – volume: 144 start-page: 4123 year: 1997 ident: 10.1016/j.tsf.2005.12.203_bib11 publication-title: J. Electrochem. Soc. doi: 10.1149/1.1838153 contributor: fullname: Homma – volume: 76 start-page: 108 year: 1998 ident: 10.1016/j.tsf.2005.12.203_bib4 publication-title: Trans. Inst. Met. Finish. doi: 10.1080/00202967.1998.11871206 contributor: fullname: Wu – volume: 178 start-page: 93 year: 2001 ident: 10.1016/j.tsf.2005.12.203_bib23 publication-title: Appl. Surf. Sci. doi: 10.1016/S0169-4332(01)00247-1 contributor: fullname: Kordás – volume: 130 start-page: 2472 year: 1983 ident: 10.1016/j.tsf.2005.12.203_bib18 publication-title: J. Electrochem. Soc. doi: 10.1149/1.2119616 contributor: fullname: Don – volume: 35 start-page: 53 year: 1993 ident: 10.1016/j.tsf.2005.12.203_bib8 publication-title: Mater. Chem. Phys. doi: 10.1016/0254-0584(93)90176-M contributor: fullname: Lin – volume: 116 start-page: 279 year: 1983 ident: 10.1016/j.tsf.2005.12.203_bib7 publication-title: Thin Solid Films doi: 10.1016/0040-6090(84)90448-6 contributor: fullname: Szasz – volume: 127 start-page: 2578 year: 1980 ident: 10.1016/j.tsf.2005.12.203_bib17 publication-title: J. Electrochem. Soc. doi: 10.1149/1.2129523 contributor: fullname: Singh – volume: 124 start-page: 8 year: 2002 ident: 10.1016/j.tsf.2005.12.203_bib14 publication-title: J. Mater. Process. Technol. doi: 10.1016/S0924-0136(01)01021-4 contributor: fullname: Haowen – start-page: 98 year: 1990 ident: 10.1016/j.tsf.2005.12.203_bib25 contributor: fullname: Mallory – volume: 179 start-page: 124 year: 2004 ident: 10.1016/j.tsf.2005.12.203_bib9 publication-title: Surf. Coat. Technol. doi: 10.1016/S0257-8972(03)00866-1 contributor: fullname: Ambat – volume: 27 start-page: 31 year: 1946 ident: 10.1016/j.tsf.2005.12.203_bib1 publication-title: J. Res. Natl. Bur. Stand. doi: 10.6028/jres.037.019 contributor: fullname: Brenner – volume: 131 start-page: 51 year: 1984 ident: 10.1016/j.tsf.2005.12.203_bib3 publication-title: J. Electrochem. Soc. doi: 10.1149/1.2115541 contributor: fullname: Flis – volume: 185 start-page: 289 year: 2002 ident: 10.1016/j.tsf.2005.12.203_bib20 publication-title: Appl. Surf. Sci. doi: 10.1016/S0169-4332(01)00982-5 contributor: fullname: Rohan – volume: 233 start-page: 180 year: 2004 ident: 10.1016/j.tsf.2005.12.203_bib12 publication-title: Appl. Surf. Sci. doi: 10.1016/j.apsusc.2004.03.014 contributor: fullname: Tsai – volume: 16 start-page: 3934 year: 1998 ident: 10.1016/j.tsf.2005.12.203_bib15 publication-title: J. Vac. Sci. Technol., B doi: 10.1116/1.590440 contributor: fullname: Tada – volume: 151 start-page: C680 year: 2004 ident: 10.1016/j.tsf.2005.12.203_bib26 publication-title: J. Electrochem. Soc. doi: 10.1149/1.1793691 contributor: fullname: Liu |
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Snippet | The sensitization, activation, nucleation and growth of electroless Ni–P deposition on silicon in an acid plating bath with sodium hydrophosphite as reducing... The sensitization, activation, nucleation and growth of electroless Ni-P deposition on silicon in an acid plating bath with sodium hydrophosphite as reducing... |
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SubjectTerms | Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Electroless deposition Electron and ion emission by liquids and solids; impact phenomena Equations of state, phase equilibria, and phase transitions Exact sciences and technology Field emission, ionization, evaporation, and desorption General studies of phase transitions Nickel Nucleation Physics Scanning electron microscopy |
Title | Temperature and pH dependence of the electroless Ni–P deposition on silicon |
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