Temperature and pH dependence of the electroless Ni–P deposition on silicon

The sensitization, activation, nucleation and growth of electroless Ni–P deposition on silicon in an acid plating bath with sodium hydrophosphite as reducing agent and sodium succinate as complexing agent were studied by transmission electron microscopy, field emission scanning electron microscopy a...

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Published inThin solid films Vol. 510; no. 1; pp. 102 - 106
Main Authors Liu, W.L., Hsieh, S.H., Tsai, T.K., Chen, W.J., Wu, Shin Shyan
Format Journal Article
LanguageEnglish
Published Lausanne Elsevier B.V 03.07.2006
Elsevier Science
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Abstract The sensitization, activation, nucleation and growth of electroless Ni–P deposition on silicon in an acid plating bath with sodium hydrophosphite as reducing agent and sodium succinate as complexing agent were studied by transmission electron microscopy, field emission scanning electron microscopy and atomic force microscopy. The results show that a continuous polycrystalline SnCl 2 film was formed on the silicon surface in the sensitization process, and small crystalline Pd particles were dispersedly produced on SnCl 2 film in the activation process. In the initial deposition stage, the small Ni–P particles had already emerged on the silicon surface in a deposition time of less than 2 s. When Ni–P particles grew, their size increased but their number decreased, and they later developed into a columnar structure. The deposition rate of the electroless Ni–P deposit increased as the pH value and the temperature of the plating bath increased (from 1.36 to 29.66 μm/h). The activation energy of the electroless Ni–P deposition on silicon increased as the pH value of the plating bath decreased (from 68.8 to 79.4 kJ/mol).
AbstractList The sensitization, activation, nucleation and growth of electroless Ni–P deposition on silicon in an acid plating bath with sodium hydrophosphite as reducing agent and sodium succinate as complexing agent were studied by transmission electron microscopy, field emission scanning electron microscopy and atomic force microscopy. The results show that a continuous polycrystalline SnCl 2 film was formed on the silicon surface in the sensitization process, and small crystalline Pd particles were dispersedly produced on SnCl 2 film in the activation process. In the initial deposition stage, the small Ni–P particles had already emerged on the silicon surface in a deposition time of less than 2 s. When Ni–P particles grew, their size increased but their number decreased, and they later developed into a columnar structure. The deposition rate of the electroless Ni–P deposit increased as the pH value and the temperature of the plating bath increased (from 1.36 to 29.66 μm/h). The activation energy of the electroless Ni–P deposition on silicon increased as the pH value of the plating bath decreased (from 68.8 to 79.4 kJ/mol).
The sensitization, activation, nucleation and growth of electroless Ni-P deposition on silicon in an acid plating bath with sodium hydrophosphite as reducing agent and sodium succinate as complexing agent were studied by transmission electron microscopy, field emission scanning electron microscopy and atomic force microscopy. The results show that a continuous polycrystalline SnCl2 film was formed on the silicon surface in the sensitization process, and small crystalline Pd particles were dispersedly produced on SnCl2 film in the activation process. In the initial deposition stage, the small Ni-P particles had already emerged on the silicon surface in a deposition time of less than 2 s. When Ni-P particles grew, their size increased but their number decreased, and they later developed into a columnar structure. The deposition rate of the electroless Ni-P deposit increased as the pH value and the temperature of the plating bath increased (from 1.36 to 29.66 D*mm/h). The activation energy of the electroless Ni-P deposition on silicon increased as the pH value of the plating bath decreased (from 68.8 to 79.4 kJ/mol).
Author Liu, W.L.
Hsieh, S.H.
Tsai, T.K.
Wu, Shin Shyan
Chen, W.J.
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Cites_doi 10.1016/S0013-4686(00)00442-4
10.1149/1.1393575
10.1016/S0167-9317(99)00323-8
10.1149/1.2404059
10.1016/0040-6090(79)90358-4
10.1149/1.1837663
10.1149/1.2085771
10.1016/S1359-6454(99)00371-7
10.1016/0169-4332(94)00564-8
10.1149/1.1838153
10.1080/00202967.1998.11871206
10.1016/S0169-4332(01)00247-1
10.1149/1.2119616
10.1016/0254-0584(93)90176-M
10.1016/0040-6090(84)90448-6
10.1149/1.2129523
10.1016/S0924-0136(01)01021-4
10.1016/S0257-8972(03)00866-1
10.6028/jres.037.019
10.1149/1.2115541
10.1016/S0169-4332(01)00982-5
10.1016/j.apsusc.2004.03.014
10.1116/1.590440
10.1149/1.1793691
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Issue 1
Keywords Scanning electron microscopy
Nickel
Electroless deposition
Temperature dependence
Atomic force microscopy
Particle size
Inorganic compounds
Nucleation
Thick films
Polycrystals
Experimental study
Field emission electron microscopy
Columnar structure
Growth kinetic
Transmission electron microscopy
Growth mechanism
Crystal growth from solutions
Electrodeposition
Activation energy
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References Liu, Hsieh, Tsai, Chen (bib26) 2004; 151
Wang, Fei, Yu, Zhao (bib22) 1995; 84
Lin, Jong (bib8) 1993; 35
Mallory, Hajdu (bib25) 1990
Shacham-Diamad, Sverdlov (bib16) 2000; 50
Haowen, Bangwei (bib14) 2002; 124
Rohan, O'Riordan, Boardman (bib20) 2002; 185
Tsai, Chao (bib12) 2004; 233
Ambat, Zhou (bib9) 2004; 179
Homma, Naito, Takai, Osaka, Yamazaki, Namikawa (bib2) 1991; 138
Wu, Hu, Zhang, Zhang (bib4) 1998; 76
Cachet, Froment, Souteyrand (bib13) 1989; 139
Homma, Tanabe, Itakura, Osaka (bib11) 1997; 144
Takano, Niwa, Yamada, Osaka (bib24) 2000; 45
Tada, Kanayama (bib15) 1998; 16
Backovic, Jancic, Radonjic (bib6) 1976; 59
Kordás, Remes, Leppävuori (bib23) 2001; 178
Flis, Duquette (bib3) 1984; 131
Szasz, Kojnok, Kertesz, Paal, Hegedus (bib7) 1983; 116
Brenner, Riddell (bib1) 1946; 27
Singh, Mitra (bib17) 1980; 127
Don, Popovici, Dascalu, Brezeanu, Popa (bib18) 1983; 130
Lin, Chen (bib21) 2000; 147
Hentschel, Isheim, Kirchheim, Müller, Kreye (bib10) 2000; 48
Lynch, Pehrsson, Leonard, Calvert (bib19) 1997; 144
Chow, Hedgecock, Schlesinger, Rezek (bib5) 1972; 119
Haowen (10.1016/j.tsf.2005.12.203_bib14) 2002; 124
Rohan (10.1016/j.tsf.2005.12.203_bib20) 2002; 185
Lynch (10.1016/j.tsf.2005.12.203_bib19) 1997; 144
Cachet (10.1016/j.tsf.2005.12.203_bib13) 1989; 139
Lin (10.1016/j.tsf.2005.12.203_bib8) 1993; 35
Singh (10.1016/j.tsf.2005.12.203_bib17) 1980; 127
Lin (10.1016/j.tsf.2005.12.203_bib21) 2000; 147
Szasz (10.1016/j.tsf.2005.12.203_bib7) 1983; 116
Ambat (10.1016/j.tsf.2005.12.203_bib9) 2004; 179
Takano (10.1016/j.tsf.2005.12.203_bib24) 2000; 45
Flis (10.1016/j.tsf.2005.12.203_bib3) 1984; 131
Backovic (10.1016/j.tsf.2005.12.203_bib6) 1976; 59
Chow (10.1016/j.tsf.2005.12.203_bib5) 1972; 119
Tsai (10.1016/j.tsf.2005.12.203_bib12) 2004; 233
Shacham-Diamad (10.1016/j.tsf.2005.12.203_bib16) 2000; 50
Hentschel (10.1016/j.tsf.2005.12.203_bib10) 2000; 48
Kordás (10.1016/j.tsf.2005.12.203_bib23) 2001; 178
Brenner (10.1016/j.tsf.2005.12.203_bib1) 1946; 27
Homma (10.1016/j.tsf.2005.12.203_bib2) 1991; 138
Wu (10.1016/j.tsf.2005.12.203_bib4) 1998; 76
Tada (10.1016/j.tsf.2005.12.203_bib15) 1998; 16
Wang (10.1016/j.tsf.2005.12.203_bib22) 1995; 84
Don (10.1016/j.tsf.2005.12.203_bib18) 1983; 130
Liu (10.1016/j.tsf.2005.12.203_bib26) 2004; 151
Homma (10.1016/j.tsf.2005.12.203_bib11) 1997; 144
Mallory (10.1016/j.tsf.2005.12.203_bib25) 1990
References_xml – volume: 35
  start-page: 53
  year: 1993
  ident: bib8
  publication-title: Mater. Chem. Phys.
  contributor:
    fullname: Jong
– volume: 119
  start-page: 1614
  year: 1972
  ident: bib5
  publication-title: J. Electrochem. Soc.
  contributor:
    fullname: Rezek
– volume: 144
  start-page: 4123
  year: 1997
  ident: bib11
  publication-title: J. Electrochem. Soc.
  contributor:
    fullname: Osaka
– volume: 151
  start-page: C680
  year: 2004
  ident: bib26
  publication-title: J. Electrochem. Soc.
  contributor:
    fullname: Chen
– volume: 131
  start-page: 51
  year: 1984
  ident: bib3
  publication-title: J. Electrochem. Soc.
  contributor:
    fullname: Duquette
– volume: 27
  start-page: 31
  year: 1946
  ident: bib1
  publication-title: J. Res. Natl. Bur. Stand.
  contributor:
    fullname: Riddell
– volume: 16
  start-page: 3934
  year: 1998
  ident: bib15
  publication-title: J. Vac. Sci. Technol., B
  contributor:
    fullname: Kanayama
– start-page: 98
  year: 1990
  ident: bib25
  publication-title: Electroless Plating: Fundamentals and Application
  contributor:
    fullname: Hajdu
– volume: 76
  start-page: 108
  year: 1998
  ident: bib4
  publication-title: Trans. Inst. Met. Finish.
  contributor:
    fullname: Zhang
– volume: 179
  start-page: 124
  year: 2004
  ident: bib9
  publication-title: Surf. Coat. Technol.
  contributor:
    fullname: Zhou
– volume: 127
  start-page: 2578
  year: 1980
  ident: bib17
  publication-title: J. Electrochem. Soc.
  contributor:
    fullname: Mitra
– volume: 178
  start-page: 93
  year: 2001
  ident: bib23
  publication-title: Appl. Surf. Sci.
  contributor:
    fullname: Leppävuori
– volume: 130
  start-page: 2472
  year: 1983
  ident: bib18
  publication-title: J. Electrochem. Soc.
  contributor:
    fullname: Popa
– volume: 139
  start-page: 462
  year: 1989
  ident: bib13
  publication-title: J. Electrochem. Soc.
  contributor:
    fullname: Souteyrand
– volume: 144
  start-page: 1698
  year: 1997
  ident: bib19
  publication-title: J. Electrochem. Soc.
  contributor:
    fullname: Calvert
– volume: 48
  start-page: 933
  year: 2000
  ident: bib10
  publication-title: Acta Mater.
  contributor:
    fullname: Kreye
– volume: 233
  start-page: 180
  year: 2004
  ident: bib12
  publication-title: Appl. Surf. Sci.
  contributor:
    fullname: Chao
– volume: 45
  start-page: 3263
  year: 2000
  ident: bib24
  publication-title: Electrochim. Acta
  contributor:
    fullname: Osaka
– volume: 147
  start-page: 2604
  year: 2000
  ident: bib21
  publication-title: J. Electrochem. Soc.
  contributor:
    fullname: Chen
– volume: 116
  start-page: 279
  year: 1983
  ident: bib7
  publication-title: Thin Solid Films
  contributor:
    fullname: Hegedus
– volume: 59
  start-page: 1
  year: 1976
  ident: bib6
  publication-title: Thin Solid Films
  contributor:
    fullname: Radonjic
– volume: 185
  start-page: 289
  year: 2002
  ident: bib20
  publication-title: Appl. Surf. Sci.
  contributor:
    fullname: Boardman
– volume: 124
  start-page: 8
  year: 2002
  ident: bib14
  publication-title: J. Mater. Process. Technol.
  contributor:
    fullname: Bangwei
– volume: 84
  start-page: 383
  year: 1995
  ident: bib22
  publication-title: Appl. Surf. Sci.
  contributor:
    fullname: Zhao
– volume: 50
  start-page: 525
  year: 2000
  ident: bib16
  publication-title: Microelectron. Eng.
  contributor:
    fullname: Sverdlov
– volume: 138
  start-page: 1269
  year: 1991
  ident: bib2
  publication-title: J. Electrochem. Soc.
  contributor:
    fullname: Namikawa
– volume: 45
  start-page: 3263
  year: 2000
  ident: 10.1016/j.tsf.2005.12.203_bib24
  publication-title: Electrochim. Acta
  doi: 10.1016/S0013-4686(00)00442-4
  contributor:
    fullname: Takano
– volume: 147
  start-page: 2604
  year: 2000
  ident: 10.1016/j.tsf.2005.12.203_bib21
  publication-title: J. Electrochem. Soc.
  doi: 10.1149/1.1393575
  contributor:
    fullname: Lin
– volume: 50
  start-page: 525
  year: 2000
  ident: 10.1016/j.tsf.2005.12.203_bib16
  publication-title: Microelectron. Eng.
  doi: 10.1016/S0167-9317(99)00323-8
  contributor:
    fullname: Shacham-Diamad
– volume: 119
  start-page: 1614
  year: 1972
  ident: 10.1016/j.tsf.2005.12.203_bib5
  publication-title: J. Electrochem. Soc.
  doi: 10.1149/1.2404059
  contributor:
    fullname: Chow
– volume: 59
  start-page: 1
  year: 1976
  ident: 10.1016/j.tsf.2005.12.203_bib6
  publication-title: Thin Solid Films
  doi: 10.1016/0040-6090(79)90358-4
  contributor:
    fullname: Backovic
– volume: 144
  start-page: 1698
  year: 1997
  ident: 10.1016/j.tsf.2005.12.203_bib19
  publication-title: J. Electrochem. Soc.
  doi: 10.1149/1.1837663
  contributor:
    fullname: Lynch
– volume: 138
  start-page: 1269
  year: 1991
  ident: 10.1016/j.tsf.2005.12.203_bib2
  publication-title: J. Electrochem. Soc.
  doi: 10.1149/1.2085771
  contributor:
    fullname: Homma
– volume: 48
  start-page: 933
  year: 2000
  ident: 10.1016/j.tsf.2005.12.203_bib10
  publication-title: Acta Mater.
  doi: 10.1016/S1359-6454(99)00371-7
  contributor:
    fullname: Hentschel
– volume: 139
  start-page: 462
  year: 1989
  ident: 10.1016/j.tsf.2005.12.203_bib13
  publication-title: J. Electrochem. Soc.
  contributor:
    fullname: Cachet
– volume: 84
  start-page: 383
  year: 1995
  ident: 10.1016/j.tsf.2005.12.203_bib22
  publication-title: Appl. Surf. Sci.
  doi: 10.1016/0169-4332(94)00564-8
  contributor:
    fullname: Wang
– volume: 144
  start-page: 4123
  year: 1997
  ident: 10.1016/j.tsf.2005.12.203_bib11
  publication-title: J. Electrochem. Soc.
  doi: 10.1149/1.1838153
  contributor:
    fullname: Homma
– volume: 76
  start-page: 108
  year: 1998
  ident: 10.1016/j.tsf.2005.12.203_bib4
  publication-title: Trans. Inst. Met. Finish.
  doi: 10.1080/00202967.1998.11871206
  contributor:
    fullname: Wu
– volume: 178
  start-page: 93
  year: 2001
  ident: 10.1016/j.tsf.2005.12.203_bib23
  publication-title: Appl. Surf. Sci.
  doi: 10.1016/S0169-4332(01)00247-1
  contributor:
    fullname: Kordás
– volume: 130
  start-page: 2472
  year: 1983
  ident: 10.1016/j.tsf.2005.12.203_bib18
  publication-title: J. Electrochem. Soc.
  doi: 10.1149/1.2119616
  contributor:
    fullname: Don
– volume: 35
  start-page: 53
  year: 1993
  ident: 10.1016/j.tsf.2005.12.203_bib8
  publication-title: Mater. Chem. Phys.
  doi: 10.1016/0254-0584(93)90176-M
  contributor:
    fullname: Lin
– volume: 116
  start-page: 279
  year: 1983
  ident: 10.1016/j.tsf.2005.12.203_bib7
  publication-title: Thin Solid Films
  doi: 10.1016/0040-6090(84)90448-6
  contributor:
    fullname: Szasz
– volume: 127
  start-page: 2578
  year: 1980
  ident: 10.1016/j.tsf.2005.12.203_bib17
  publication-title: J. Electrochem. Soc.
  doi: 10.1149/1.2129523
  contributor:
    fullname: Singh
– volume: 124
  start-page: 8
  year: 2002
  ident: 10.1016/j.tsf.2005.12.203_bib14
  publication-title: J. Mater. Process. Technol.
  doi: 10.1016/S0924-0136(01)01021-4
  contributor:
    fullname: Haowen
– start-page: 98
  year: 1990
  ident: 10.1016/j.tsf.2005.12.203_bib25
  contributor:
    fullname: Mallory
– volume: 179
  start-page: 124
  year: 2004
  ident: 10.1016/j.tsf.2005.12.203_bib9
  publication-title: Surf. Coat. Technol.
  doi: 10.1016/S0257-8972(03)00866-1
  contributor:
    fullname: Ambat
– volume: 27
  start-page: 31
  year: 1946
  ident: 10.1016/j.tsf.2005.12.203_bib1
  publication-title: J. Res. Natl. Bur. Stand.
  doi: 10.6028/jres.037.019
  contributor:
    fullname: Brenner
– volume: 131
  start-page: 51
  year: 1984
  ident: 10.1016/j.tsf.2005.12.203_bib3
  publication-title: J. Electrochem. Soc.
  doi: 10.1149/1.2115541
  contributor:
    fullname: Flis
– volume: 185
  start-page: 289
  year: 2002
  ident: 10.1016/j.tsf.2005.12.203_bib20
  publication-title: Appl. Surf. Sci.
  doi: 10.1016/S0169-4332(01)00982-5
  contributor:
    fullname: Rohan
– volume: 233
  start-page: 180
  year: 2004
  ident: 10.1016/j.tsf.2005.12.203_bib12
  publication-title: Appl. Surf. Sci.
  doi: 10.1016/j.apsusc.2004.03.014
  contributor:
    fullname: Tsai
– volume: 16
  start-page: 3934
  year: 1998
  ident: 10.1016/j.tsf.2005.12.203_bib15
  publication-title: J. Vac. Sci. Technol., B
  doi: 10.1116/1.590440
  contributor:
    fullname: Tada
– volume: 151
  start-page: C680
  year: 2004
  ident: 10.1016/j.tsf.2005.12.203_bib26
  publication-title: J. Electrochem. Soc.
  doi: 10.1149/1.1793691
  contributor:
    fullname: Liu
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Snippet The sensitization, activation, nucleation and growth of electroless Ni–P deposition on silicon in an acid plating bath with sodium hydrophosphite as reducing...
The sensitization, activation, nucleation and growth of electroless Ni-P deposition on silicon in an acid plating bath with sodium hydrophosphite as reducing...
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SubjectTerms Condensed matter: electronic structure, electrical, magnetic, and optical properties
Condensed matter: structure, mechanical and thermal properties
Electroless deposition
Electron and ion emission by liquids and solids; impact phenomena
Equations of state, phase equilibria, and phase transitions
Exact sciences and technology
Field emission, ionization, evaporation, and desorption
General studies of phase transitions
Nickel
Nucleation
Physics
Scanning electron microscopy
Title Temperature and pH dependence of the electroless Ni–P deposition on silicon
URI https://dx.doi.org/10.1016/j.tsf.2005.12.203
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